Benninghoven, A. (1984). Secondary ion mass spectrometry: SIMS IV ; proceedings of the fourth international conference, Osaka, Japan, November 13 - 19, 1983. Springer.
Chicago Style (17th ed.) CitationBenninghoven, Alfred. Secondary Ion Mass Spectrometry: SIMS IV ; Proceedings of the Fourth International Conference, Osaka, Japan, November 13 - 19, 1983. Berlin [u.a.]: Springer, 1984.
MLA (9th ed.) CitationBenninghoven, Alfred. Secondary Ion Mass Spectrometry: SIMS IV ; Proceedings of the Fourth International Conference, Osaka, Japan, November 13 - 19, 1983. Springer, 1984.
Warning: These citations may not always be 100% accurate.