Holdings: Transmission electron microscopy

Transmission electron microscopy: physics of image formation and microanalysis

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Bibliographic Details
Main Author:	Reimer, Ludwig 1928- (Author)
Format:	Book
Language:	English
Published:	Berlin [u.a.] Springer 1984
Series:	Springer series in optical sciences 36
Subjects:	Transmission electron microscopy Kristallstruktur Beugung Physik Durchstrahlungselektronenmikroskopie Elektronenmikroskopie Elektron Mikroanalyse
Physical Description:	XII, 521 S. Ill.
ISBN:	3540117946 0387117946

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Record in the Search Index

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discipline	Allgemeine Naturwissenschaft Physik Chemie
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isbn	3540117946 0387117946
language	English
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physical	XII, 521 S. Ill.
publishDate	1984
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record_format	marc
series	Springer series in optical sciences
series2	Springer series in optical sciences
spelling	Reimer, Ludwig 1928- Verfasser (DE-588)13230130X aut Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer Berlin [u.a.] Springer 1984 XII, 521 S. Ill. txt rdacontent n rdamedia nc rdacarrier Springer series in optical sciences 36 Transmission electron microscopy Kristallstruktur (DE-588)4136176-3 gnd rswk-swf Beugung (DE-588)4145094-2 gnd rswk-swf Physik (DE-588)4045956-1 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektron (DE-588)4125978-6 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s DE-604 Elektron (DE-588)4125978-6 s 1\p DE-604 Physik (DE-588)4045956-1 s 2\p DE-604 Beugung (DE-588)4145094-2 s 3\p DE-604 Mikroanalyse (DE-588)4169804-6 s 4\p DE-604 Kristallstruktur (DE-588)4136176-3 s 5\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 6\p DE-604 Erscheint auch als Online-Ausgabe 978-3-662-13553-2 Springer series in optical sciences 36 (DE-604)BV000000237 36 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 6\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Reimer, Ludwig 1928- Transmission electron microscopy physics of image formation and microanalysis Springer series in optical sciences Transmission electron microscopy Kristallstruktur (DE-588)4136176-3 gnd Beugung (DE-588)4145094-2 gnd Physik (DE-588)4045956-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektron (DE-588)4125978-6 gnd Mikroanalyse (DE-588)4169804-6 gnd
subject_GND	(DE-588)4136176-3 (DE-588)4145094-2 (DE-588)4045956-1 (DE-588)4215608-7 (DE-588)4014327-2 (DE-588)4125978-6 (DE-588)4169804-6
title	Transmission electron microscopy physics of image formation and microanalysis
title_auth	Transmission electron microscopy physics of image formation and microanalysis
title_exact_search	Transmission electron microscopy physics of image formation and microanalysis
title_full	Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer
title_fullStr	Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer
title_full_unstemmed	Transmission electron microscopy physics of image formation and microanalysis Ludwig Reimer
title_short	Transmission electron microscopy
title_sort	transmission electron microscopy physics of image formation and microanalysis
title_sub	physics of image formation and microanalysis
topic	Transmission electron microscopy Kristallstruktur (DE-588)4136176-3 gnd Beugung (DE-588)4145094-2 gnd Physik (DE-588)4045956-1 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektron (DE-588)4125978-6 gnd Mikroanalyse (DE-588)4169804-6 gnd
topic_facet	Transmission electron microscopy Kristallstruktur Beugung Physik Durchstrahlungselektronenmikroskopie Elektronenmikroskopie Elektron Mikroanalyse
volume_link	(DE-604)BV000000237
work_keys_str_mv	AT reimerludwig transmissionelectronmicroscopyphysicsofimageformationandmicroanalysis

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