Tunneling field effect transistor technology:
Gespeichert in:
Weitere Verfasser: | , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
[Cham]
Springer International Publishing
[2016]
|
Schlagworte: | |
Online-Zugang: | BTU01 FAB01 FAW01 FHA01 FHI01 FHN01 FHR01 FKE01 FRO01 FWS01 FWS02 UBY01 Volltext Inhaltsverzeichnis Abstract |
Beschreibung: | 1 Online-Ressource (vi, 213 p. 147 illus., 122 illus. in color) |
ISBN: | 9783319316536 |
DOI: | 10.1007/978-3-319-31653-6 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV043546527 | ||
003 | DE-604 | ||
005 | 20160603 | ||
007 | cr|uuu---uuuuu | ||
008 | 160510s2016 |||| o||u| ||||||eng d | ||
020 | |a 9783319316536 |c Online |9 978-3-319-31653-6 | ||
024 | 7 | |a 10.1007/978-3-319-31653-6 |2 doi | |
035 | |a (ZDB-2-ENG)978-3-319-31653-6 | ||
035 | |a (OCoLC)950705933 | ||
035 | |a (DE-599)BVBBV043546527 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-706 |a DE-1046 |a DE-1043 |a DE-Aug4 |a DE-898 |a DE-861 |a DE-573 |a DE-859 |a DE-863 |a DE-634 |a DE-862 |a DE-92 | ||
082 | 0 | |a 621.3815 |2 23 | |
245 | 1 | 0 | |a Tunneling field effect transistor technology |c Lining Zhang, Mansun Chan editor |
264 | 1 | |a [Cham] |b Springer International Publishing |c [2016] | |
264 | 4 | |c © 2016 | |
300 | |a 1 Online-Ressource (vi, 213 p. 147 illus., 122 illus. in color) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
650 | 4 | |a Engineering | |
650 | 4 | |a Electronic circuits | |
650 | 4 | |a Electronics | |
650 | 4 | |a Microelectronics | |
650 | 4 | |a Circuits and Systems | |
650 | 4 | |a Electronic Circuits and Devices | |
650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
650 | 4 | |a Ingenieurwissenschaften | |
700 | 1 | |a Zhang, Lining |4 edt | |
700 | 1 | |a Chan, Mansun |4 edt | |
776 | 0 | 8 | |i Erscheint auch als |n Druckausgabe |z 978-3-319-31651-2 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-3-319-31653-6 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
856 | 4 | 2 | |m Springer Fremddatenuebernahme |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028961890&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
856 | 4 | 2 | |m Springer Fremddatenuebernahme |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028961890&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |3 Abstract |
912 | |a ZDB-2-ENG | ||
940 | 1 | |q ZDB-2-ENG_2016 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-028961890 | ||
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FAB01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FAW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FHA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FKE01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FRO01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FWS01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l FWS02 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-319-31653-6 |l UBY01 |p ZDB-2-ENG |x Verlag |3 Volltext |
Datensatz im Suchindex
DE-BY-FWS_katkey | 617257 |
---|---|
_version_ | 1806179742935678976 |
adam_text | TUNNELING FIELD EFFECT TRANSISTOR TECHNOLOGY
/
: 2016
TABLE OF CONTENTS / INHALTSVERZEICHNIS
STEEP SLOPE DEVICES AND TFETS
TUNNEL-FET FABRICATION AND CHARACTERIZATION
COMPACT MODELS OF TFETS
CHALLENGES AND DESIGNS OF TFET FOR DIGITAL APPLICATIONS
ATOMISTIC SIMULATIONS OF TUNNELING FETS
QUANTUM TRANSPORT SIMULATION OF III-V TFETS WITH REDUCED-ORDER K P
METHOD
CARBON NANOTUBE TFETS: STRUCTURE OPTIMIZATION WITH NUMERICAL SIMULATION
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
TUNNELING FIELD EFFECT TRANSISTOR TECHNOLOGY
/
: 2016
ABSTRACT / INHALTSTEXT
THIS BOOK PROVIDES A SINGLE-SOURCE REFERENCE TO THE STATE-OF-THE ART IN
TUNNELING FIELD EFFECT TRANSISTORS (TFETS). READERS WILL LEARN THE TFETS
PHYSICS FROM ADVANCED ATOMISTIC SIMULATIONS, THE TFETS FABRICATION
PROCESS AND THE IMPORTANT ROLES THAT TFETS WILL PLAY IN ENABLING
INTEGRATED CIRCUIT DESIGNS FOR POWER EFFICIENCY. PROVIDES
COMPREHENSIVE REFERENCE TO TUNNELING FIELD EFFECT TRANSISTORS (TFETS);
COVERS ALL ASPECTS OF TFETS, FROM DEVICE PROCESS TO MODELING AND
APPLICATIONS; ENABLES DESIGN OF POWER-EFFICIENT INTEGRATED CIRCUITS,
WITH LOW POWER CONSUMPTION TFETS
DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
|
any_adam_object | 1 |
author2 | Zhang, Lining Chan, Mansun |
author2_role | edt edt |
author2_variant | l z lz m c mc |
author_facet | Zhang, Lining Chan, Mansun |
building | Verbundindex |
bvnumber | BV043546527 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)978-3-319-31653-6 (OCoLC)950705933 (DE-599)BVBBV043546527 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-3-319-31653-6 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03251nmm a2200625zc 4500</leader><controlfield tag="001">BV043546527</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20160603 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">160510s2016 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319316536</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-319-31653-6</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-319-31653-6</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)978-3-319-31653-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)950705933</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV043546527</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-706</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-859</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Tunneling field effect transistor technology</subfield><subfield code="c">Lining Zhang, Mansun Chan editor</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">[Cham]</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">[2016]</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2016</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (vi, 213 p. 147 illus., 122 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Ingenieurwissenschaften</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Zhang, Lining</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chan, Mansun</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druckausgabe</subfield><subfield code="z">978-3-319-31651-2</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Springer Fremddatenuebernahme</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028961890&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Springer Fremddatenuebernahme</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028961890&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Abstract</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2016</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-028961890</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FAB01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-319-31653-6</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV043546527 |
illustrated | Not Illustrated |
indexdate | 2024-08-01T12:13:51Z |
institution | BVB |
isbn | 9783319316536 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-028961890 |
oclc_num | 950705933 |
open_access_boolean | |
owner | DE-706 DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-573 DE-859 DE-863 DE-BY-FWS DE-634 DE-862 DE-BY-FWS DE-92 |
owner_facet | DE-706 DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-573 DE-859 DE-863 DE-BY-FWS DE-634 DE-862 DE-BY-FWS DE-92 |
physical | 1 Online-Ressource (vi, 213 p. 147 illus., 122 illus. in color) |
psigel | ZDB-2-ENG ZDB-2-ENG_2016 |
publishDate | 2016 |
publishDateSearch | 2016 |
publishDateSort | 2016 |
publisher | Springer International Publishing |
record_format | marc |
spellingShingle | Tunneling field effect transistor technology Engineering Electronic circuits Electronics Microelectronics Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Ingenieurwissenschaften |
title | Tunneling field effect transistor technology |
title_auth | Tunneling field effect transistor technology |
title_exact_search | Tunneling field effect transistor technology |
title_full | Tunneling field effect transistor technology Lining Zhang, Mansun Chan editor |
title_fullStr | Tunneling field effect transistor technology Lining Zhang, Mansun Chan editor |
title_full_unstemmed | Tunneling field effect transistor technology Lining Zhang, Mansun Chan editor |
title_short | Tunneling field effect transistor technology |
title_sort | tunneling field effect transistor technology |
topic | Engineering Electronic circuits Electronics Microelectronics Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Ingenieurwissenschaften |
topic_facet | Engineering Electronic circuits Electronics Microelectronics Circuits and Systems Electronic Circuits and Devices Electronics and Microelectronics, Instrumentation Ingenieurwissenschaften |
url | https://doi.org/10.1007/978-3-319-31653-6 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028961890&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=028961890&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT zhanglining tunnelingfieldeffecttransistortechnology AT chanmansun tunnelingfieldeffecttransistortechnology |