Showing 1 - 4 results of 4 for search 'Wang, Laung-Terng', query time: 0.01s Refine Results
In addition to media from the THWS, media from other Bavarian libraries are also displayed.
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  1. 1
    System-on-chip test architectures : nanometer design for testability /

    System-on-chip test architectures : nanometer design for testability /

    Published 2008
    Other Authors: “…Wang, Laung-Terng…”
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    Electronic eBook


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  2. 2
    VLSI test principles and architectures : design for testability /

    VLSI test principles and architectures : design for testability /

    Published 2006
    Other Authors: “…Wang, Laung-Terng…”
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    Electronic eBook


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  3. 3
    VLSI test principles and architectures design for testability

    VLSI test principles and architectures design for testability

    Published 2006
    Other Authors: “…Wang, Laung-Terng…”
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  4. 4
    VLSI test principles and architectures design for testability

    VLSI test principles and architectures design for testability

    Published 2006
    Other Authors: “…Wang, Laung-Terng…”
    Get full text
    Electronic eBook Interlibrary loan Place Request


    Saved in:

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