Microcircuit device reliability: memory digital LSI; minter 1981/82
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Griffiss Air Force Base, NY
Reliability Analysis Center
1981
|
| Schlagworte: | |
| Beschreibung: | IX, 443 S. graph. Darst. |
Internformat
MARC
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| 100 | 1 | |a Dey, Kieron A. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Microcircuit device reliability |b memory digital LSI; minter 1981/82 |c Kieron A. Dey ; Wayne E. Turkowski* |
| 264 | 1 | |a Griffiss Air Force Base, NY |b Reliability Analysis Center |c 1981 | |
| 300 | |a IX, 443 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Computer storage devices |x Reliability | |
| 650 | 4 | |a Semiconductor storage devices |x Reliability | |
| 700 | 1 | |a Turkowski, Wayne E. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001314086 | ||
Datensatz im Suchindex
| _version_ | 1804116461646512128 |
|---|---|
| any_adam_object | |
| author | Dey, Kieron A. Turkowski, Wayne E. |
| author_facet | Dey, Kieron A. Turkowski, Wayne E. |
| author_role | aut aut |
| author_sort | Dey, Kieron A. |
| author_variant | k a d ka kad w e t we wet |
| building | Verbundindex |
| bvnumber | BV002013287 |
| callnumber-first | T - Technology |
| callnumber-label | TK7895 |
| callnumber-raw | TK7895.M4 |
| callnumber-search | TK7895.M4 |
| callnumber-sort | TK 47895 M4 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)606349198 (DE-599)BVBBV002013287 |
| format | Book |
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| id | DE-604.BV002013287 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:38:53Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001314086 |
| oclc_num | 606349198 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | IX, 443 S. graph. Darst. |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Reliability Analysis Center |
| record_format | marc |
| spelling | Dey, Kieron A. Verfasser aut Microcircuit device reliability memory digital LSI; minter 1981/82 Kieron A. Dey ; Wayne E. Turkowski* Griffiss Air Force Base, NY Reliability Analysis Center 1981 IX, 443 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Computer storage devices Reliability Semiconductor storage devices Reliability Turkowski, Wayne E. Verfasser aut |
| spellingShingle | Dey, Kieron A. Turkowski, Wayne E. Microcircuit device reliability memory digital LSI; minter 1981/82 Computer storage devices Reliability Semiconductor storage devices Reliability |
| title | Microcircuit device reliability memory digital LSI; minter 1981/82 |
| title_auth | Microcircuit device reliability memory digital LSI; minter 1981/82 |
| title_exact_search | Microcircuit device reliability memory digital LSI; minter 1981/82 |
| title_full | Microcircuit device reliability memory digital LSI; minter 1981/82 Kieron A. Dey ; Wayne E. Turkowski* |
| title_fullStr | Microcircuit device reliability memory digital LSI; minter 1981/82 Kieron A. Dey ; Wayne E. Turkowski* |
| title_full_unstemmed | Microcircuit device reliability memory digital LSI; minter 1981/82 Kieron A. Dey ; Wayne E. Turkowski* |
| title_short | Microcircuit device reliability |
| title_sort | microcircuit device reliability memory digital lsi minter 1981 82 |
| title_sub | memory digital LSI; minter 1981/82 |
| topic | Computer storage devices Reliability Semiconductor storage devices Reliability |
| topic_facet | Computer storage devices Reliability Semiconductor storage devices Reliability |
| work_keys_str_mv | AT deykierona microcircuitdevicereliabilitymemorydigitallsiminter198182 AT turkowskiwaynee microcircuitdevicereliabilitymemorydigitallsiminter198182 |