Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments: ISMTII 2003 : 28 November 2003 - 1 December 2003
Gespeichert in:
Körperschaft: | |
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Weitere Verfasser: | , |
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Hong Kong
Hong Kong University of Science and Technology
2003
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Schlagworte: | |
Beschreibung: | Auf dem Cover: "A simplified version abstracts and references of papers accepted for presentation ISMTII 2003" Symposium held on 28 November 2003-1 December 2003 at the Hong Kong University of Science and Technology, Kowloon, Hong Kong |
Beschreibung: | x, 156 Seiten 29 cm |
ISBN: | 9628640305 9789628640300 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV049514221 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 240124s2003 b||| 10||| eng d | ||
020 | |a 9628640305 |9 962-86403-0-5 | ||
020 | |a 9789628640300 |9 9789628640300 | ||
035 | |a (OCoLC)1422422621 | ||
035 | |a (DE-599)BVBBV049514221 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-91 | ||
110 | 2 | |a International Symposium on Measurement Technology and Intelligent Instruments |n 6th |d 2003 |c Hong Kong, China |e Verfasser |4 aut | |
245 | 1 | 0 | |a Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments |b ISMTII 2003 : 28 November 2003 - 1 December 2003 |c edited by Yongsheng Gao, Shuet Fung Tse |
246 | 1 | 0 | |a Measurement technology and intelligent instruments |
264 | 1 | |a Hong Kong |b Hong Kong University of Science and Technology |c 2003 | |
264 | 4 | |c © 2003 | |
300 | |a x, 156 Seiten |c 29 cm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a Auf dem Cover: "A simplified version abstracts and references of papers accepted for presentation ISMTII 2003" | ||
500 | |a Symposium held on 28 November 2003-1 December 2003 at the Hong Kong University of Science and Technology, Kowloon, Hong Kong | ||
653 | 0 | |a Engineering instruments / Congresses | |
653 | 0 | |a Measuring instruments / Congresses | |
653 | 0 | |a Engineering instruments / Abstracts | |
653 | 0 | |a Measuring instruments / Abstracts | |
653 | 0 | |a Ingénierie / Instruments / Congrès | |
653 | 0 | |a Mesure / Instruments / Congrès | |
653 | 0 | |a Ingénierie / Instruments / Résumés analytiques | |
653 | 0 | |a Mesure / Instruments / Résumés analytiques | |
653 | 0 | |a Engineering instruments | |
653 | 0 | |a Measuring instruments | |
653 | 6 | |a Abstracts | |
653 | 6 | |a Conference papers and proceedings | |
653 | 6 | |a Abstracts | |
653 | 6 | |a Résumés analytiques | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Gao, Yongsheng |4 edt | |
700 | 1 | |a Tse, Shuet-fung |4 edt | |
710 | 2 | |a Hong Kong University of Science and Technology |b Department of Mechanical Engineering |e Sonstige |0 (DE-588)6028109-1 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-034860195 |
Datensatz im Suchindex
_version_ | 1804186331119616000 |
---|---|
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author2 | Gao, Yongsheng Tse, Shuet-fung |
author2_role | edt edt |
author2_variant | y g yg s f t sft |
author_corporate | International Symposium on Measurement Technology and Intelligent Instruments |
author_corporate_role | aut |
author_facet | Gao, Yongsheng Tse, Shuet-fung International Symposium on Measurement Technology and Intelligent Instruments |
author_sort | International Symposium on Measurement Technology and Intelligent Instruments |
building | Verbundindex |
bvnumber | BV049514221 |
ctrlnum | (OCoLC)1422422621 (DE-599)BVBBV049514221 |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02295nam a2200529 c 4500</leader><controlfield tag="001">BV049514221</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">240124s2003 b||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9628640305</subfield><subfield code="9">962-86403-0-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789628640300</subfield><subfield code="9">9789628640300</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1422422621</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV049514221</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">International Symposium on Measurement Technology and Intelligent Instruments</subfield><subfield code="n">6th</subfield><subfield code="d">2003</subfield><subfield code="c">Hong Kong, China</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments</subfield><subfield code="b">ISMTII 2003 : 28 November 2003 - 1 December 2003</subfield><subfield code="c">edited by Yongsheng Gao, Shuet Fung Tse</subfield></datafield><datafield tag="246" ind1="1" ind2="0"><subfield code="a">Measurement technology and intelligent instruments</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hong Kong</subfield><subfield code="b">Hong Kong University of Science and Technology</subfield><subfield code="c">2003</subfield></datafield><datafield tag="264" ind1=" " ind2="4"><subfield code="c">© 2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">x, 156 Seiten</subfield><subfield code="c">29 cm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Auf dem Cover: "A simplified version abstracts and references of papers accepted for presentation ISMTII 2003"</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Symposium held on 28 November 2003-1 December 2003 at the Hong Kong University of Science and Technology, Kowloon, Hong Kong</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Engineering instruments / Congresses</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Measuring instruments / Congresses</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Engineering instruments / Abstracts</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Measuring instruments / Abstracts</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Ingénierie / Instruments / Congrès</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Mesure / Instruments / Congrès</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Ingénierie / Instruments / Résumés analytiques</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Mesure / Instruments / Résumés analytiques</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Engineering instruments</subfield></datafield><datafield tag="653" ind1=" " ind2="0"><subfield code="a">Measuring instruments</subfield></datafield><datafield tag="653" ind1=" " ind2="6"><subfield code="a">Abstracts</subfield></datafield><datafield tag="653" ind1=" " ind2="6"><subfield code="a">Conference papers and proceedings</subfield></datafield><datafield tag="653" ind1=" " ind2="6"><subfield code="a">Abstracts</subfield></datafield><datafield tag="653" ind1=" " ind2="6"><subfield code="a">Résumés analytiques</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Gao, Yongsheng</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tse, Shuet-fung</subfield><subfield code="4">edt</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Hong Kong University of Science and Technology</subfield><subfield code="b">Department of Mechanical Engineering</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)6028109-1</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034860195</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV049514221 |
illustrated | Not Illustrated |
index_date | 2024-07-03T23:23:39Z |
indexdate | 2024-07-10T10:09:25Z |
institution | BVB |
institution_GND | (DE-588)6028109-1 |
isbn | 9628640305 9789628640300 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034860195 |
oclc_num | 1422422621 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
physical | x, 156 Seiten 29 cm |
publishDate | 2003 |
publishDateSearch | 2003 |
publishDateSort | 2003 |
publisher | Hong Kong University of Science and Technology |
record_format | marc |
spelling | International Symposium on Measurement Technology and Intelligent Instruments 6th 2003 Hong Kong, China Verfasser aut Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 edited by Yongsheng Gao, Shuet Fung Tse Measurement technology and intelligent instruments Hong Kong Hong Kong University of Science and Technology 2003 © 2003 x, 156 Seiten 29 cm txt rdacontent n rdamedia nc rdacarrier Auf dem Cover: "A simplified version abstracts and references of papers accepted for presentation ISMTII 2003" Symposium held on 28 November 2003-1 December 2003 at the Hong Kong University of Science and Technology, Kowloon, Hong Kong Engineering instruments / Congresses Measuring instruments / Congresses Engineering instruments / Abstracts Measuring instruments / Abstracts Ingénierie / Instruments / Congrès Mesure / Instruments / Congrès Ingénierie / Instruments / Résumés analytiques Mesure / Instruments / Résumés analytiques Engineering instruments Measuring instruments Abstracts Conference papers and proceedings Résumés analytiques (DE-588)1071861417 Konferenzschrift gnd-content Gao, Yongsheng edt Tse, Shuet-fung edt Hong Kong University of Science and Technology Department of Mechanical Engineering Sonstige (DE-588)6028109-1 oth |
spellingShingle | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 |
subject_GND | (DE-588)1071861417 |
title | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 |
title_alt | Measurement technology and intelligent instruments |
title_auth | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 |
title_exact_search | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 |
title_exact_search_txtP | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 |
title_full | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 edited by Yongsheng Gao, Shuet Fung Tse |
title_fullStr | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 edited by Yongsheng Gao, Shuet Fung Tse |
title_full_unstemmed | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments ISMTII 2003 : 28 November 2003 - 1 December 2003 edited by Yongsheng Gao, Shuet Fung Tse |
title_short | Proceedings of the Sixth International Symposium on Measurement Technology and Intelligent Instruments |
title_sort | proceedings of the sixth international symposium on measurement technology and intelligent instruments ismtii 2003 28 november 2003 1 december 2003 |
title_sub | ISMTII 2003 : 28 November 2003 - 1 December 2003 |
topic_facet | Konferenzschrift |
work_keys_str_mv | AT internationalsymposiumonmeasurementtechnologyandintelligentinstruments proceedingsofthesixthinternationalsymposiumonmeasurementtechnologyandintelligentinstrumentsismtii200328november20031december2003 AT gaoyongsheng proceedingsofthesixthinternationalsymposiumonmeasurementtechnologyandintelligentinstrumentsismtii200328november20031december2003 AT tseshuetfung proceedingsofthesixthinternationalsymposiumonmeasurementtechnologyandintelligentinstrumentsismtii200328november20031december2003 AT hongkonguniversityofscienceandtechnologydepartmentofmechanicalengineering proceedingsofthesixthinternationalsymposiumonmeasurementtechnologyandintelligentinstrumentsismtii200328november20031december2003 AT internationalsymposiumonmeasurementtechnologyandintelligentinstruments measurementtechnologyandintelligentinstruments AT gaoyongsheng measurementtechnologyandintelligentinstruments AT tseshuetfung measurementtechnologyandintelligentinstruments AT hongkonguniversityofscienceandtechnologydepartmentofmechanicalengineering measurementtechnologyandintelligentinstruments |