EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy: techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA
Saved in:
| Other Authors: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | Undetermined |
| Published: |
New York [u.a.]
Plenum Press
1981
|
| Subjects: | |
| Physical Description: | VIII, 275 S.: Ill. |
| ISBN: | 0306406543 |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV025239546 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 100417s1981 |||| 10||| und d | ||
| 020 | |a 0306406543 |9 0-306-40654-3 | ||
| 035 | |a (OCoLC)917007997 | ||
| 035 | |a (DE-599)BVBBV025239546 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | |a und | ||
| 049 | |a DE-11 | ||
| 084 | |a UP 9310 |0 (DE-625)146458: |2 rvk | ||
| 084 | |a UQ 5600 |0 (DE-625)146528: |2 rvk | ||
| 245 | 1 | 0 | |a EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy |b techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA |c ed. by B. K. Teo and D. C. Joy |
| 264 | 1 | |a New York [u.a.] |b Plenum Press |c 1981 | |
| 300 | |a VIII, 275 S.: Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 0 | 7 | |a Röntgenabsorptionsfeinstruktur |0 (DE-588)4178302-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a EXAFS |0 (DE-588)4015942-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Analytische Chemie |0 (DE-588)4129906-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Synchrotronstrahlung |0 (DE-588)4184235-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Konferenz |0 (DE-588)4032055-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronen-Energieverlustspektroskopie |0 (DE-588)4123130-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Analytische Chemie |0 (DE-588)4129906-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a EXAFS |0 (DE-588)4015942-5 |D s |
| 689 | 1 | |5 DE-604 | |
| 689 | 2 | 0 | |a Elektronen-Energieverlustspektroskopie |0 (DE-588)4123130-2 |D s |
| 689 | 2 | |5 DE-604 | |
| 689 | 3 | 0 | |a Synchrotronstrahlung |0 (DE-588)4184235-2 |D s |
| 689 | 3 | |5 DE-604 | |
| 689 | 4 | 0 | |a Konferenz |0 (DE-588)4032055-8 |D s |
| 689 | 4 | |5 DE-604 | |
| 689 | 5 | 0 | |a Röntgenabsorptionsfeinstruktur |0 (DE-588)4178302-5 |D s |
| 689 | 5 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Teo, B. K. |4 edt | |
| 711 | 2 | |a Symposium on the Applications of EXAFS to Materials Science |d 1979 |c Boston, Mass. |j Sonstige |0 (DE-588)5000858-4 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-019878208 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Record in the Search Index
| _version_ | 1804142295077879808 |
|---|---|
| any_adam_object | |
| author2 | Teo, B. K. |
| author2_role | edt |
| author2_variant | b k t bk bkt |
| author_facet | Teo, B. K. |
| building | Verbundindex |
| bvnumber | BV025239546 |
| classification_rvk | UP 9310 UQ 5600 |
| ctrlnum | (OCoLC)917007997 (DE-599)BVBBV025239546 |
| discipline | Physik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02241nam a2200529 c 4500</leader><controlfield tag="001">BV025239546</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">100417s1981 |||| 10||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0306406543</subfield><subfield code="9">0-306-40654-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)917007997</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV025239546</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-11</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 9310</subfield><subfield code="0">(DE-625)146458:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 5600</subfield><subfield code="0">(DE-625)146528:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy</subfield><subfield code="b">techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA</subfield><subfield code="c">ed. by B. K. Teo and D. C. Joy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York [u.a.]</subfield><subfield code="b">Plenum Press</subfield><subfield code="c">1981</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VIII, 275 S.: Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenabsorptionsfeinstruktur</subfield><subfield code="0">(DE-588)4178302-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">EXAFS</subfield><subfield code="0">(DE-588)4015942-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Analytische Chemie</subfield><subfield code="0">(DE-588)4129906-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Synchrotronstrahlung</subfield><subfield code="0">(DE-588)4184235-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Konferenz</subfield><subfield code="0">(DE-588)4032055-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronen-Energieverlustspektroskopie</subfield><subfield code="0">(DE-588)4123130-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Analytische Chemie</subfield><subfield code="0">(DE-588)4129906-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">EXAFS</subfield><subfield code="0">(DE-588)4015942-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Elektronen-Energieverlustspektroskopie</subfield><subfield code="0">(DE-588)4123130-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Synchrotronstrahlung</subfield><subfield code="0">(DE-588)4184235-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Konferenz</subfield><subfield code="0">(DE-588)4032055-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="5" ind2="0"><subfield code="a">Röntgenabsorptionsfeinstruktur</subfield><subfield code="0">(DE-588)4178302-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="5" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Teo, B. K.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">Symposium on the Applications of EXAFS to Materials Science</subfield><subfield code="d">1979</subfield><subfield code="c">Boston, Mass.</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5000858-4</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-019878208</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV025239546 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T22:29:29Z |
| institution | BVB |
| institution_GND | (DE-588)5000858-4 |
| isbn | 0306406543 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-019878208 |
| oclc_num | 917007997 |
| open_access_boolean | |
| owner | DE-11 |
| owner_facet | DE-11 |
| physical | VIII, 275 S.: Ill. |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Plenum Press |
| record_format | marc |
| spelling | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA ed. by B. K. Teo and D. C. Joy New York [u.a.] Plenum Press 1981 VIII, 275 S.: Ill. txt rdacontent n rdamedia nc rdacarrier Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd rswk-swf EXAFS (DE-588)4015942-5 gnd rswk-swf Analytische Chemie (DE-588)4129906-1 gnd rswk-swf Synchrotronstrahlung (DE-588)4184235-2 gnd rswk-swf Konferenz (DE-588)4032055-8 gnd rswk-swf Elektronen-Energieverlustspektroskopie (DE-588)4123130-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Analytische Chemie (DE-588)4129906-1 s DE-604 EXAFS (DE-588)4015942-5 s Elektronen-Energieverlustspektroskopie (DE-588)4123130-2 s Synchrotronstrahlung (DE-588)4184235-2 s Konferenz (DE-588)4032055-8 s Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 s 1\p DE-604 Teo, B. K. edt Symposium on the Applications of EXAFS to Materials Science 1979 Boston, Mass. Sonstige (DE-588)5000858-4 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd EXAFS (DE-588)4015942-5 gnd Analytische Chemie (DE-588)4129906-1 gnd Synchrotronstrahlung (DE-588)4184235-2 gnd Konferenz (DE-588)4032055-8 gnd Elektronen-Energieverlustspektroskopie (DE-588)4123130-2 gnd |
| subject_GND | (DE-588)4178302-5 (DE-588)4015942-5 (DE-588)4129906-1 (DE-588)4184235-2 (DE-588)4032055-8 (DE-588)4123130-2 (DE-588)1071861417 |
| title | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA |
| title_auth | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA |
| title_exact_search | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA |
| title_full | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA ed. by B. K. Teo and D. C. Joy |
| title_fullStr | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA ed. by B. K. Teo and D. C. Joy |
| title_full_unstemmed | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA ed. by B. K. Teo and D. C. Joy |
| title_short | EXAFS [Extended X-Ray Absorption Fine Structure] spectroscopy |
| title_sort | exafs extended x ray absorption fine structure spectroscopy techniques and applications based on the proceedings of a symposium on applications of exafs to material science held at the 1979 meeting of the materials research society november 26 30 1979 in boston ma |
| title_sub | techniques and applications; based on the proceedings of a symposium on applications of EXAFS to material science, held at the 1979 meeting of the Materials Research Society, November 26-30, 1979, in Boston, MA |
| topic | Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd EXAFS (DE-588)4015942-5 gnd Analytische Chemie (DE-588)4129906-1 gnd Synchrotronstrahlung (DE-588)4184235-2 gnd Konferenz (DE-588)4032055-8 gnd Elektronen-Energieverlustspektroskopie (DE-588)4123130-2 gnd |
| topic_facet | Röntgenabsorptionsfeinstruktur EXAFS Analytische Chemie Synchrotronstrahlung Konferenz Elektronen-Energieverlustspektroskopie Konferenzschrift |
| work_keys_str_mv | AT teobk exafsextendedxrayabsorptionfinestructurespectroscopytechniquesandapplicationsbasedontheproceedingsofasymposiumonapplicationsofexafstomaterialscienceheldatthe1979meetingofthematerialsresearchsocietynovember26301979inbostonma AT symposiumontheapplicationsofexafstomaterialssciencebostonmass exafsextendedxrayabsorptionfinestructurespectroscopytechniquesandapplicationsbasedontheproceedingsofasymposiumonapplicationsofexafstomaterialscienceheldatthe1979meetingofthematerialsresearchsocietynovember26301979inbostonma |