Fault-tolerance through reconfiguration of VLSI and WSI arrays:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Cambridge, Mass. u.a.
MIT Pr.
1989
|
| Schriftenreihe: | MIT Press series in computer systems
|
| Schlagworte: | |
| Beschreibung: | 301 S. |
| ISBN: | 0262140446 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV002506185 | ||
| 003 | DE-604 | ||
| 005 | 19900319 | ||
| 007 | t | ||
| 008 | 900314s1989 |||| 00||| engod | ||
| 020 | |a 0262140446 |9 0-262-14044-6 | ||
| 035 | |a (OCoLC)18290085 | ||
| 035 | |a (DE-599)BVBBV002506185 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 |a DE-739 |a DE-83 |a DE-11 | ||
| 050 | 0 | |a QA76.9.F38 | |
| 082 | 0 | |a 004.2 |2 19 | |
| 084 | |a ST 190 |0 (DE-625)143607: |2 rvk | ||
| 100 | 1 | |a Negrini, R. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Fault-tolerance through reconfiguration of VLSI and WSI arrays |c R. Negrini ; M. G. Sami ; R. Stefanelli |
| 264 | 1 | |a Cambridge, Mass. u.a. |b MIT Pr. |c 1989 | |
| 300 | |a 301 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a MIT Press series in computer systems | |
| 650 | 4 | |a Integrated circuits |x Fault tolerance | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration | |
| 650 | 4 | |a Integrated circuits |x Wafer-scale integration | |
| 650 | 0 | 7 | |a Wafer-Integration |0 (DE-588)4226609-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Fehlertoleranz |0 (DE-588)4123192-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Fehlertoleranz |0 (DE-588)4123192-2 |D s |
| 689 | 0 | 1 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Fehlertoleranz |0 (DE-588)4123192-2 |D s |
| 689 | 1 | 1 | |a Wafer-Integration |0 (DE-588)4226609-9 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Sami, Mariagiovanna |e Verfasser |4 aut | |
| 700 | 1 | |a Stefanelli, Renato |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-001614313 | ||
Datensatz im Suchindex
| _version_ | 1804116912151461888 |
|---|---|
| any_adam_object | |
| author | Negrini, R. Sami, Mariagiovanna Stefanelli, Renato |
| author_facet | Negrini, R. Sami, Mariagiovanna Stefanelli, Renato |
| author_role | aut aut aut |
| author_sort | Negrini, R. |
| author_variant | r n rn m s ms r s rs |
| building | Verbundindex |
| bvnumber | BV002506185 |
| callnumber-first | Q - Science |
| callnumber-label | QA76 |
| callnumber-raw | QA76.9.F38 |
| callnumber-search | QA76.9.F38 |
| callnumber-sort | QA 276.9 F38 |
| callnumber-subject | QA - Mathematics |
| classification_rvk | ST 190 |
| ctrlnum | (OCoLC)18290085 (DE-599)BVBBV002506185 |
| dewey-full | 004.2 |
| dewey-hundreds | 000 - Computer science, information, general works |
| dewey-ones | 004 - Computer science |
| dewey-raw | 004.2 |
| dewey-search | 004.2 |
| dewey-sort | 14.2 |
| dewey-tens | 000 - Computer science, information, general works |
| discipline | Informatik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01635nam a2200469 c 4500</leader><controlfield tag="001">BV002506185</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19900319 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">900314s1989 |||| 00||| engod</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0262140446</subfield><subfield code="9">0-262-14044-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)18290085</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV002506185</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-739</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QA76.9.F38</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">004.2</subfield><subfield code="2">19</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 190</subfield><subfield code="0">(DE-625)143607:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Negrini, R.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Fault-tolerance through reconfiguration of VLSI and WSI arrays</subfield><subfield code="c">R. Negrini ; M. G. Sami ; R. Stefanelli</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cambridge, Mass. u.a.</subfield><subfield code="b">MIT Pr.</subfield><subfield code="c">1989</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">301 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">MIT Press series in computer systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Fault tolerance</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Wafer-scale integration</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Wafer-Integration</subfield><subfield code="0">(DE-588)4226609-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Wafer-Integration</subfield><subfield code="0">(DE-588)4226609-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sami, Mariagiovanna</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Stefanelli, Renato</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-001614313</subfield></datafield></record></collection> |
| id | DE-604.BV002506185 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T15:46:02Z |
| institution | BVB |
| isbn | 0262140446 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001614313 |
| oclc_num | 18290085 |
| open_access_boolean | |
| owner | DE-12 DE-739 DE-83 DE-11 |
| owner_facet | DE-12 DE-739 DE-83 DE-11 |
| physical | 301 S. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | MIT Pr. |
| record_format | marc |
| series2 | MIT Press series in computer systems |
| spelling | Negrini, R. Verfasser aut Fault-tolerance through reconfiguration of VLSI and WSI arrays R. Negrini ; M. G. Sami ; R. Stefanelli Cambridge, Mass. u.a. MIT Pr. 1989 301 S. txt rdacontent n rdamedia nc rdacarrier MIT Press series in computer systems Integrated circuits Fault tolerance Integrated circuits Very large scale integration Integrated circuits Wafer-scale integration Wafer-Integration (DE-588)4226609-9 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 s VLSI (DE-588)4117388-0 s DE-604 Wafer-Integration (DE-588)4226609-9 s Sami, Mariagiovanna Verfasser aut Stefanelli, Renato Verfasser aut |
| spellingShingle | Negrini, R. Sami, Mariagiovanna Stefanelli, Renato Fault-tolerance through reconfiguration of VLSI and WSI arrays Integrated circuits Fault tolerance Integrated circuits Very large scale integration Integrated circuits Wafer-scale integration Wafer-Integration (DE-588)4226609-9 gnd VLSI (DE-588)4117388-0 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
| subject_GND | (DE-588)4226609-9 (DE-588)4117388-0 (DE-588)4123192-2 |
| title | Fault-tolerance through reconfiguration of VLSI and WSI arrays |
| title_auth | Fault-tolerance through reconfiguration of VLSI and WSI arrays |
| title_exact_search | Fault-tolerance through reconfiguration of VLSI and WSI arrays |
| title_full | Fault-tolerance through reconfiguration of VLSI and WSI arrays R. Negrini ; M. G. Sami ; R. Stefanelli |
| title_fullStr | Fault-tolerance through reconfiguration of VLSI and WSI arrays R. Negrini ; M. G. Sami ; R. Stefanelli |
| title_full_unstemmed | Fault-tolerance through reconfiguration of VLSI and WSI arrays R. Negrini ; M. G. Sami ; R. Stefanelli |
| title_short | Fault-tolerance through reconfiguration of VLSI and WSI arrays |
| title_sort | fault tolerance through reconfiguration of vlsi and wsi arrays |
| topic | Integrated circuits Fault tolerance Integrated circuits Very large scale integration Integrated circuits Wafer-scale integration Wafer-Integration (DE-588)4226609-9 gnd VLSI (DE-588)4117388-0 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
| topic_facet | Integrated circuits Fault tolerance Integrated circuits Very large scale integration Integrated circuits Wafer-scale integration Wafer-Integration VLSI Fehlertoleranz |
| work_keys_str_mv | AT negrinir faulttolerancethroughreconfigurationofvlsiandwsiarrays AT samimariagiovanna faulttolerancethroughreconfigurationofvlsiandwsiarrays AT stefanellirenato faulttolerancethroughreconfigurationofvlsiandwsiarrays |