Verfügbarkeit: Ion beams in materials processing and analysis

Ion beams in materials processing and analysis:

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Schmidt, Bernd 1948- (VerfasserIn), Wetzig, Klaus (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	Vienna Springer 2013
Schlagworte:	Electronics Optical materials Werkstoffkunde Ionenstrahlanalyse Ionenstrahlbearbeitung Ionenstrahl Werkstoffprüfung Materialbearbeitung Werkstoff
Online-Zugang:	UBT01 Volltext Inhaltsverzeichnis Abstract
Beschreibung:	1 Online-Ressource
ISBN:	9783211993552 9783211993569
DOI:	10.1007/978-3-211-99356-9

Internformat

MARC


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Datensatz im Suchindex

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adam_text	ION BEAMS IN MATERIALS PROCESSING AND ANALYSIS / SCHMIDT, BERND : 2013 TABLE OF CONTENTS / INHALTSVERZEICHNIS PREFACE 1. INTRODUCTION 2. ION- SOLID INTERACTIONS 2.1 FUNDAMENTAL PRINCIPLES 2.2 BINARY ELASTIC COLLISIONS 2.3 ION STOPPING 2.4 ION CHANNELING 2.5 ION INDUCED TARGET MODIFICATIONS 3. ION BEAM TECHNOLOGY 3.1 PRINCIPLES OF ION ACCELERATORS 3.2 ION SOURCES 3.3 ION ACCELERATION 3.4 ION BEAM HANDLING 3.5 ION IMPLANTATION SYSTEMS 3.6 ELECTROSTATIC ION ACCELERATOR SYSTEMS 3.7 FOCUSED ION BEAM SYSTEMS 4. MATERIALS PROCESSING 4.1 ION IRRADIATION EFFECTS IN CRYSTALLINE MATERIALS 4.2 ION IMPLANTATION INTO SEMICONDUCTORS 4.3 ION BEAM SYNTHESIS OF NEW PHASES IN SOLIDS 4.4 ION BEAM MIXING OF INTERFACES 4.5 ION BEAM SLICING OF THIN LAYERS (SMART-CUT FOR SOI AND SOLAR CELLS) 4.6 ION BEAM EROSION, SPUTTERING AND SURFACE PATTERNING (RIPPLES AND DOTS) 4.7 ION BEAM SHAPING OF NANOMATERIALS 4.8 ION BEAM PROCESSING OF OTHER MATERIALS 5. ION BEAM PREPARATION OF MATERIALS 5.1 REMOVAL OF TARGET ATOMS BY SPUTTERING 5.2 EFFECTS ON SPUTTERING YIELD 5.3 PREPARATION STEPS BY ION BEAM IRRADIATION 5.4 FOCUS ION BEAM (FIB) PREPARATION 6. ION BEAM ANALYSIS BY ION BEAMS 6.1 INTRODUCTION 6.2 ION BEAM ANALYTICAL TECHNIQUES – A SURVEY 6.3 ION BEAM SCATTERING TECHNIQUES 6.4 ION BEAM INDUCED PHOTON EMISSION 6.5 NUCLEAR REACTION ANALYSIS (NRA) 6.6 ION BEAM INDUCED ELECTRON AND LIGHT EMISSION 6.7 SECONDARY ION EMISSION 6.8 ION BEAM IMAGING TECHNIQUES 7. SPECIAL ION BEAM APPLICATIONS IN MATERIALS ANALYSIS PROBLEMS 7.1 FUNCTIONAL THIN FILMS AND LAYERS 7.2 ION BEAM ANALYSIS IN ART AND ARCHEOMETRY 7.3 SPECIAL APPLICATIONS IN LIFE SCIENCES INDEX DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT. ION BEAMS IN MATERIALS PROCESSING AND ANALYSIS / SCHMIDT, BERND : 2013 ABSTRACT / INHALTSTEXT A COMPREHENSIVE REVIEW OF ION BEAM APPLICATION IN MODERN MATERIALS RESEARCH IS PROVIDED, INCLUDING THE BASICS OF ION BEAM PHYSICS AND TECHNOLOGY. THE PHYSICS OF ION-SOLID INTERACTIONS FOR ION IMPLANTATION, ION BEAM SYNTHESIS, SPUTTERING AND NANO-PATTERNING IS TREATED IN DETAIL. ITS APPLICATIONS IN MATERIALS RESEARCH, DEVELOPMENT AND ANALYSIS, DEVELOPMENTS OF SPECIAL TECHNIQUES AND INTERACTION MECHANISMS OF ION BEAMS WITH SOLID STATE MATTER RESULT IN THE OPTIMIZATION OF NEW MATERIAL PROPERTIES, WHICH ARE DISCUSSED THOROUGHLY. SOLID-STATE PROPERTIES OPTIMIZATION FOR FUNCTIONAL MATERIALS SUCH AS DOPED SEMICONDUCTORS AND METAL LAYERS FOR NANO-ELECTRONICS, METAL ALLOYS, AND NANO-PATTERNED SURFACES IS DEMONSTRATED. THE ION BEAM IS AN IMPORTANT TOOL FOR BOTH MATERIALS PROCESSING AND ANALYSIS. RESEARCHERS ENGAGED IN SOLID-STATE PHYSICS AND MATERIALS RESEARCH, ENGINEERS AND TECHNOLOGISTS IN THE FIELD OF MODERN FUNCTIONAL MATERIALS WILL WELCOME THIS TEXT DIESES SCHRIFTSTUECK WURDE MASCHINELL ERZEUGT.
any_adam_object	1
author	Schmidt, Bernd 1948- Wetzig, Klaus
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author_facet	Schmidt, Bernd 1948- Wetzig, Klaus
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ctrlnum	(OCoLC)827053973 (DE-599)HBZTT050417812
dewey-full	620.11295 620.11297
dewey-hundreds	600 - Technology (Applied sciences)
dewey-ones	620 - Engineering and allied operations
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dewey-tens	620 - Engineering and allied operations
discipline	Werkstoffwissenschaften / Fertigungstechnik
doi_str_mv	10.1007/978-3-211-99356-9
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spelling	Schmidt, Bernd 1948- Verfasser (DE-588)1034403788 aut Ion beams in materials processing and analysis Bernd Schmidt ; Klaus Wetzig Vienna Springer 2013 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier Electronics Optical materials Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Ionenstrahlanalyse (DE-588)4569698-6 gnd rswk-swf Ionenstrahlbearbeitung (DE-588)4277034-8 gnd rswk-swf Ionenstrahl (DE-588)4162347-2 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Materialbearbeitung (DE-588)4139082-9 gnd rswk-swf Werkstoff (DE-588)4065579-9 gnd rswk-swf Werkstoff (DE-588)4065579-9 s Materialbearbeitung (DE-588)4139082-9 s Ionenstrahl (DE-588)4162347-2 s Ionenstrahlbearbeitung (DE-588)4277034-8 s DE-604 Werkstoffprüfung (DE-588)4037934-6 s Ionenstrahlanalyse (DE-588)4569698-6 s Werkstoffkunde (DE-588)4079184-1 s 1\p DE-604 Wetzig, Klaus Verfasser aut https://doi.org/10.1007/978-3-211-99356-9 Verlag Volltext Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025705041&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Springer Fremddatenuebernahme application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025705041&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Abstract 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Schmidt, Bernd 1948- Wetzig, Klaus Ion beams in materials processing and analysis Electronics Optical materials Werkstoffkunde (DE-588)4079184-1 gnd Ionenstrahlanalyse (DE-588)4569698-6 gnd Ionenstrahlbearbeitung (DE-588)4277034-8 gnd Ionenstrahl (DE-588)4162347-2 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Materialbearbeitung (DE-588)4139082-9 gnd Werkstoff (DE-588)4065579-9 gnd
subject_GND	(DE-588)4079184-1 (DE-588)4569698-6 (DE-588)4277034-8 (DE-588)4162347-2 (DE-588)4037934-6 (DE-588)4139082-9 (DE-588)4065579-9
title	Ion beams in materials processing and analysis
title_auth	Ion beams in materials processing and analysis
title_exact_search	Ion beams in materials processing and analysis
title_full	Ion beams in materials processing and analysis Bernd Schmidt ; Klaus Wetzig
title_fullStr	Ion beams in materials processing and analysis Bernd Schmidt ; Klaus Wetzig
title_full_unstemmed	Ion beams in materials processing and analysis Bernd Schmidt ; Klaus Wetzig
title_short	Ion beams in materials processing and analysis
title_sort	ion beams in materials processing and analysis
topic	Electronics Optical materials Werkstoffkunde (DE-588)4079184-1 gnd Ionenstrahlanalyse (DE-588)4569698-6 gnd Ionenstrahlbearbeitung (DE-588)4277034-8 gnd Ionenstrahl (DE-588)4162347-2 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Materialbearbeitung (DE-588)4139082-9 gnd Werkstoff (DE-588)4065579-9 gnd
topic_facet	Electronics Optical materials Werkstoffkunde Ionenstrahlanalyse Ionenstrahlbearbeitung Ionenstrahl Werkstoffprüfung Materialbearbeitung Werkstoff
url	https://doi.org/10.1007/978-3-211-99356-9 http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025705041&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=025705041&sequence=000003&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA
work_keys_str_mv	AT schmidtbernd ionbeamsinmaterialsprocessingandanalysis AT wetzigklaus ionbeamsinmaterialsprocessingandanalysis

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