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  1. 1
    Kelvin probe force microscopy measuring and compensating electrostatic forces

    Kelvin probe force microscopy measuring and compensating electrostatic forces

    Published 2012
    Other Authors: “…Sadewasser, Sascha…”
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  2. 2
    Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization

    Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization

    Published 2018
    Other Authors: “…Sadewasser, Sascha…”
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