Manoj Sachdev

Manoj Sachdev from the University of Waterloo, Waterloo, ON, Canada was named Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 2012 ''for contributions to test methodology for very large scale integrated circuits''. Provided by Wikipedia
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  1. 1
    ESD protection device and circuit design for advanced CMOS technologies

    ESD protection device and circuit design for advanced CMOS technologies by Semenov, Oleg S., Sarbishaei, Hossein, Sachdev, Manoj 1962-

    Published 2008
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  2. 2
    Defect-oriented testing for nano-metric CMOS VLSI circuits 2. ed.

    Defect-oriented testing for nano-metric CMOS VLSI circuits 2. ed. by Sachdev, Manoj, Pineda de Gyvez, José

    Published 2007
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  3. 3
    Defect Oriented Testing for CMOS Analog and Digital Circuits

    Defect Oriented Testing for CMOS Analog and Digital Circuits by Sachdev, Manoj

    Published 1999
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  4. 4
    CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test

    CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test by Pavlov, Andrei 1990-, Sachdev, Manoj

    Published 2008
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  5. 5
    Defect oriented testing for CMOS analog and digital circuits

    Defect oriented testing for CMOS analog and digital circuits by Sachdev, Manoj

    Published 1998
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  6. 6
    Thermal and power management of integrated circuits

    Thermal and power management of integrated circuits by Sachdev, Manoj

    Published 2006
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