Machine vision applications in industrial inspection XI: 22-24 January 2003, Santa Clara, California, USA
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Bellingham, Washington
SPIE
[2003]
|
| Schriftenreihe: | Proceedings of SPIE
vol. 5011 |
| Schlagworte: | |
| Beschreibung: | vii, 324 Seiten |
| ISBN: | 0819448117 |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
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| dewey-ones | 670 - Manufacturing |
| dewey-raw | 670.42/5 |
| dewey-search | 670.42/5 |
| dewey-sort | 3670.42 15 |
| dewey-tens | 670 - Manufacturing |
| discipline | Werkstoffwissenschaften / Fertigungstechnik Mess-/Steuerungs-/Regelungs-/Automatisierungstechnik / Mechatronik |
| format | Book |
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| id | DE-604.BV044867515 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:03:18Z |
| institution | BVB |
| isbn | 0819448117 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030262033 |
| oclc_num | 1028931828 |
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| owner_facet | DE-11 |
| physical | vii, 324 Seiten |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | SPIE |
| record_format | marc |
| series | Proceedings of SPIE |
| series2 | Proceedings of SPIE Proceedings of electronic imaging : science and technology |
| spelling | Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA Martin A. Hunt, Jeffery R. Price, chairs/editors Bellingham, Washington SPIE [2003] © 2003 vii, 324 Seiten txt rdacontent n rdamedia nc rdacarrier Proceedings of SPIE vol. 5011 Proceedings of electronic imaging : science and technology 2003 Computer vision Industrial applications Congresses Engineering inspection Automation Congresses Measurement Congresses Quality control Optical methods Automation Congresses (DE-588)1071861417 Konferenzschrift gnd-content Tobin, Kenneth W. edt Price, Jeffery R. edt Proceedings of SPIE vol. 5011 (DE-604)BV000010887 5011 |
| spellingShingle | Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA Proceedings of SPIE Computer vision Industrial applications Congresses Engineering inspection Automation Congresses Measurement Congresses Quality control Optical methods Automation Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA |
| title_auth | Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA |
| title_exact_search | Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA |
| title_full | Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA Martin A. Hunt, Jeffery R. Price, chairs/editors |
| title_fullStr | Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA Martin A. Hunt, Jeffery R. Price, chairs/editors |
| title_full_unstemmed | Machine vision applications in industrial inspection XI 22-24 January 2003, Santa Clara, California, USA Martin A. Hunt, Jeffery R. Price, chairs/editors |
| title_short | Machine vision applications in industrial inspection XI |
| title_sort | machine vision applications in industrial inspection xi 22 24 january 2003 santa clara california usa |
| title_sub | 22-24 January 2003, Santa Clara, California, USA |
| topic | Computer vision Industrial applications Congresses Engineering inspection Automation Congresses Measurement Congresses Quality control Optical methods Automation Congresses |
| topic_facet | Computer vision Industrial applications Congresses Engineering inspection Automation Congresses Measurement Congresses Quality control Optical methods Automation Congresses Konferenzschrift |
| volume_link | (DE-604)BV000010887 |
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