EXAFS and Near Edge Structure III: Proceedings of an International Conference, Stanford, CA, July 16–20, 1984
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Format: | Elektronisch E-Book |
Sprache: | English |
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Berlin, Heidelberg
Springer Berlin Heidelberg
1984
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Schriftenreihe: | Springer Proceedings in Physics
2 |
Schlagworte: | |
Online-Zugang: | Volltext |
Beschreibung: | This volume contains the Proceedings of the Third International EXAFS Conference, hosted by Stanford University and the Stanford Synchrotron Radiation Laboratory on July 16-20, 1984. The meeting, co-chaired by Professors Arthur Bienenstock and Keith Hodgson, was attended by over 200 scientists representing a wide range of scientific disciplines. The format of the meeting consisted of 51 invited presentations and four days of poster sessions. This Proceedings is a compilation of 139 contributions from both invited speakers and authors of contributed posters. The last ten years has seen the rapid maturation of x-ray absorption spectroscopy as a scientific discipline. The vitality of the field is reflected in the diversity of applications found in the Proceedings. Recent work continues to probe the limits of x-ray spectroscopy, with proven techniques being extended to, for example, very low or high energy studies, to very dilute systems, and to studies of surface structure. In fact, the title of the conference does not at all reflect the breadth of the science discussed at this meeting. The number of fields in which xray absorption spectroscopy is finding applications has increased dramatically even in the two years since the previous International Conference held in Frascati*. The prospects for continued growth and innovation will be even further enhanced if a new generation 6 GeV storage ring is constructed in the next five years |
Beschreibung: | 1 Online-Ressource (XV, 536 p) |
ISBN: | 9783642465222 9783642465246 |
ISSN: | 0930-8989 |
DOI: | 10.1007/978-3-642-46522-2 |
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Datensatz im Suchindex
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any_adam_object | |
author2 | Hodgson, Keith O. Hedman, Britt Penner-Hahn, James E. |
author2_role | edt edt edt |
author2_variant | k o h ko koh b h bh j e p h jep jeph |
author_facet | Hodgson, Keith O. Hedman, Britt Penner-Hahn, James E. |
building | Verbundindex |
bvnumber | BV042413163 |
classification_tum | PHY 000 |
collection | ZDB-2-PHA ZDB-2-BAE |
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dewey-full | 621.36 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.36 |
dewey-search | 621.36 |
dewey-sort | 3621.36 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-3-642-46522-2 |
format | Electronic eBook |
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spelling | EXAFS and Near Edge Structure III Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 edited by Keith O. Hodgson, Britt Hedman, James E. Penner-Hahn Berlin, Heidelberg Springer Berlin Heidelberg 1984 1 Online-Ressource (XV, 536 p) txt rdacontent c rdamedia cr rdacarrier Springer Proceedings in Physics 2 0930-8989 This volume contains the Proceedings of the Third International EXAFS Conference, hosted by Stanford University and the Stanford Synchrotron Radiation Laboratory on July 16-20, 1984. The meeting, co-chaired by Professors Arthur Bienenstock and Keith Hodgson, was attended by over 200 scientists representing a wide range of scientific disciplines. The format of the meeting consisted of 51 invited presentations and four days of poster sessions. This Proceedings is a compilation of 139 contributions from both invited speakers and authors of contributed posters. The last ten years has seen the rapid maturation of x-ray absorption spectroscopy as a scientific discipline. The vitality of the field is reflected in the diversity of applications found in the Proceedings. Recent work continues to probe the limits of x-ray spectroscopy, with proven techniques being extended to, for example, very low or high energy studies, to very dilute systems, and to studies of surface structure. In fact, the title of the conference does not at all reflect the breadth of the science discussed at this meeting. The number of fields in which xray absorption spectroscopy is finding applications has increased dramatically even in the two years since the previous International Conference held in Frascati*. The prospects for continued growth and innovation will be even further enhanced if a new generation 6 GeV storage ring is constructed in the next five years Physics Analytical biochemistry Optics, Optoelectronics, Plasmonics and Optical Devices Condensed Matter Physics Analytical Chemistry XANES (DE-588)4190351-1 gnd rswk-swf Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd rswk-swf EXAFS (DE-588)4015942-5 gnd rswk-swf 1\p (DE-588)1071861417 Konferenzschrift 1984 Stanford Calif. gnd-content XANES (DE-588)4190351-1 s 2\p DE-604 Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 s 3\p DE-604 EXAFS (DE-588)4015942-5 s 4\p DE-604 Hodgson, Keith O. edt Hedman, Britt edt Penner-Hahn, James E. edt Springer Proceedings in Physics 2 (DE-604)BV000018744 2 https://doi.org/10.1007/978-3-642-46522-2 Verlag Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | EXAFS and Near Edge Structure III Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 Springer Proceedings in Physics Physics Analytical biochemistry Optics, Optoelectronics, Plasmonics and Optical Devices Condensed Matter Physics Analytical Chemistry XANES (DE-588)4190351-1 gnd Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd EXAFS (DE-588)4015942-5 gnd |
subject_GND | (DE-588)4190351-1 (DE-588)4178302-5 (DE-588)4015942-5 (DE-588)1071861417 |
title | EXAFS and Near Edge Structure III Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 |
title_auth | EXAFS and Near Edge Structure III Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 |
title_exact_search | EXAFS and Near Edge Structure III Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 |
title_full | EXAFS and Near Edge Structure III Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 edited by Keith O. Hodgson, Britt Hedman, James E. Penner-Hahn |
title_fullStr | EXAFS and Near Edge Structure III Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 edited by Keith O. Hodgson, Britt Hedman, James E. Penner-Hahn |
title_full_unstemmed | EXAFS and Near Edge Structure III Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 edited by Keith O. Hodgson, Britt Hedman, James E. Penner-Hahn |
title_short | EXAFS and Near Edge Structure III |
title_sort | exafs and near edge structure iii proceedings of an international conference stanford ca july 16 20 1984 |
title_sub | Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 |
topic | Physics Analytical biochemistry Optics, Optoelectronics, Plasmonics and Optical Devices Condensed Matter Physics Analytical Chemistry XANES (DE-588)4190351-1 gnd Röntgenabsorptionsfeinstruktur (DE-588)4178302-5 gnd EXAFS (DE-588)4015942-5 gnd |
topic_facet | Physics Analytical biochemistry Optics, Optoelectronics, Plasmonics and Optical Devices Condensed Matter Physics Analytical Chemistry XANES Röntgenabsorptionsfeinstruktur EXAFS Konferenzschrift 1984 Stanford Calif. |
url | https://doi.org/10.1007/978-3-642-46522-2 |
volume_link | (DE-604)BV000018744 |
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