CMOS SRAM circuit design and parametric test in nano-scaled technologies: process-aware SRAM design and test
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin
Springer Netherland
2008
Berlin Springer US |
| Ausgabe: | 1. ed. |
| Schriftenreihe: | Frontiers in Electronic Testing
40 |
| Schlagworte: | |
| Beschreibung: | XVI, 193 S. Ill., graph. Darst. 235 mm x 155 mm |
| ISBN: | 9781402083624 1402083629 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV035830199 | ||
| 003 | DE-604 | ||
| 005 | 20091120 | ||
| 007 | t | ||
| 008 | 091117s2008 gw ad|| |||| 00||| eng d | ||
| 015 | |a 08,N09,0732 |2 dnb | ||
| 020 | |a 9781402083624 |c Gb. : ca. EUR 106.95 (freier Pr.), ca. sfr 174.00 (freier Pr.) |9 978-1-402-08362-4 | ||
| 020 | |a 1402083629 |c Gb. : ca. EUR 106.95 (freier Pr.), ca. sfr 174.00 (freier Pr.) |9 1-402-08362-9 | ||
| 024 | 3 | |a 9781402083624 | |
| 028 | 5 | 2 | |a 11681229 |
| 035 | |a (OCoLC)634962429 | ||
| 035 | |a (DE-599)BVBBV035830199 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c XA-DE-BE | ||
| 049 | |a DE-91 | ||
| 084 | |a 620 |2 sdnb | ||
| 084 | |a ELT 358f |2 stub | ||
| 100 | 1 | |a Pavlov, Andrei |d 1990- |e Verfasser |0 (DE-588)136243452 |4 aut | |
| 245 | 1 | 0 | |a CMOS SRAM circuit design and parametric test in nano-scaled technologies |b process-aware SRAM design and test |c Andrei Pavlov ; Manoj Sachdev |
| 250 | |a 1. ed. | ||
| 264 | 1 | |a Berlin |b Springer Netherland |c 2008 | |
| 264 | 1 | |a Berlin |b Springer US | |
| 300 | |a XVI, 193 S. |b Ill., graph. Darst. |c 235 mm x 155 mm | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Frontiers in Electronic Testing |v 40 | |
| 650 | 0 | 7 | |a RAM |0 (DE-588)4176909-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a CMOS |0 (DE-588)4010319-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Nanoelektronik |0 (DE-588)4732034-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a CMOS |0 (DE-588)4010319-5 |D s |
| 689 | 0 | 1 | |a RAM |0 (DE-588)4176909-0 |D s |
| 689 | 0 | 2 | |a Nanoelektronik |0 (DE-588)4732034-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Sachdev, Manoj |e Verfasser |4 aut | |
| 830 | 0 | |a Frontiers in Electronic Testing |v 40 |w (DE-604)BV010836129 |9 40 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-018688758 | ||
Datensatz im Suchindex
| _version_ | 1804140792171724800 |
|---|---|
| any_adam_object | |
| author | Pavlov, Andrei 1990- Sachdev, Manoj |
| author_GND | (DE-588)136243452 |
| author_facet | Pavlov, Andrei 1990- Sachdev, Manoj |
| author_role | aut aut |
| author_sort | Pavlov, Andrei 1990- |
| author_variant | a p ap m s ms |
| building | Verbundindex |
| bvnumber | BV035830199 |
| classification_tum | ELT 358f |
| ctrlnum | (OCoLC)634962429 (DE-599)BVBBV035830199 |
| discipline | Maschinenbau / Maschinenwesen Elektrotechnik |
| edition | 1. ed. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01767nam a2200481 cb4500</leader><controlfield tag="001">BV035830199</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20091120 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">091117s2008 gw ad|| |||| 00||| eng d</controlfield><datafield tag="015" ind1=" " ind2=" "><subfield code="a">08,N09,0732</subfield><subfield code="2">dnb</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781402083624</subfield><subfield code="c">Gb. : ca. EUR 106.95 (freier Pr.), ca. sfr 174.00 (freier Pr.)</subfield><subfield code="9">978-1-402-08362-4</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1402083629</subfield><subfield code="c">Gb. : ca. EUR 106.95 (freier Pr.), ca. sfr 174.00 (freier Pr.)</subfield><subfield code="9">1-402-08362-9</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9781402083624</subfield></datafield><datafield tag="028" ind1="5" ind2="2"><subfield code="a">11681229</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)634962429</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV035830199</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">XA-DE-BE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">620</subfield><subfield code="2">sdnb</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 358f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Pavlov, Andrei</subfield><subfield code="d">1990-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)136243452</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">CMOS SRAM circuit design and parametric test in nano-scaled technologies</subfield><subfield code="b">process-aware SRAM design and test</subfield><subfield code="c">Andrei Pavlov ; Manoj Sachdev</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1. ed.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin</subfield><subfield code="b">Springer Netherland</subfield><subfield code="c">2008</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin</subfield><subfield code="b">Springer US</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVI, 193 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield><subfield code="c">235 mm x 155 mm</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">40</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">RAM</subfield><subfield code="0">(DE-588)4176909-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Nanoelektronik</subfield><subfield code="0">(DE-588)4732034-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">RAM</subfield><subfield code="0">(DE-588)4176909-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Nanoelektronik</subfield><subfield code="0">(DE-588)4732034-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sachdev, Manoj</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">40</subfield><subfield code="w">(DE-604)BV010836129</subfield><subfield code="9">40</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-018688758</subfield></datafield></record></collection> |
| id | DE-604.BV035830199 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T22:05:36Z |
| institution | BVB |
| isbn | 9781402083624 1402083629 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018688758 |
| oclc_num | 634962429 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | XVI, 193 S. Ill., graph. Darst. 235 mm x 155 mm |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | Springer Netherland Springer US |
| record_format | marc |
| series | Frontiers in Electronic Testing |
| series2 | Frontiers in Electronic Testing |
| spelling | Pavlov, Andrei 1990- Verfasser (DE-588)136243452 aut CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test Andrei Pavlov ; Manoj Sachdev 1. ed. Berlin Springer Netherland 2008 Berlin Springer US XVI, 193 S. Ill., graph. Darst. 235 mm x 155 mm txt rdacontent n rdamedia nc rdacarrier Frontiers in Electronic Testing 40 RAM (DE-588)4176909-0 gnd rswk-swf CMOS (DE-588)4010319-5 gnd rswk-swf Nanoelektronik (DE-588)4732034-5 gnd rswk-swf CMOS (DE-588)4010319-5 s RAM (DE-588)4176909-0 s Nanoelektronik (DE-588)4732034-5 s DE-604 Sachdev, Manoj Verfasser aut Frontiers in Electronic Testing 40 (DE-604)BV010836129 40 |
| spellingShingle | Pavlov, Andrei 1990- Sachdev, Manoj CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test Frontiers in Electronic Testing RAM (DE-588)4176909-0 gnd CMOS (DE-588)4010319-5 gnd Nanoelektronik (DE-588)4732034-5 gnd |
| subject_GND | (DE-588)4176909-0 (DE-588)4010319-5 (DE-588)4732034-5 |
| title | CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test |
| title_auth | CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test |
| title_exact_search | CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test |
| title_full | CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test Andrei Pavlov ; Manoj Sachdev |
| title_fullStr | CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test Andrei Pavlov ; Manoj Sachdev |
| title_full_unstemmed | CMOS SRAM circuit design and parametric test in nano-scaled technologies process-aware SRAM design and test Andrei Pavlov ; Manoj Sachdev |
| title_short | CMOS SRAM circuit design and parametric test in nano-scaled technologies |
| title_sort | cmos sram circuit design and parametric test in nano scaled technologies process aware sram design and test |
| title_sub | process-aware SRAM design and test |
| topic | RAM (DE-588)4176909-0 gnd CMOS (DE-588)4010319-5 gnd Nanoelektronik (DE-588)4732034-5 gnd |
| topic_facet | RAM CMOS Nanoelektronik |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT pavlovandrei cmossramcircuitdesignandparametrictestinnanoscaledtechnologiesprocessawaresramdesignandtest AT sachdevmanoj cmossramcircuitdesignandparametrictestinnanoscaledtechnologiesprocessawaresramdesignandtest |