Fringe pattern analysis for optical metrology: theory, algorithms, and applications
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Weinheim, Germany
Wiley-VCH Verlag GmbH & Co. KGaA
2014
|
| Schlagworte: | |
| Beschreibung: | Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014) |
| Beschreibung: | 1 online resource (345 pages) illustrations |
| ISBN: | 9783527411528 9783527681082 9783527681105 9783527681099 9783527681075 |
Internformat
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| 245 | 1 | 0 | |a Fringe pattern analysis for optical metrology |b theory, algorithms, and applications |c Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla |
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Datensatz im Suchindex
| _version_ | 1804177100383453184 |
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| any_adam_object | |
| author | Servín, Manuel Quiroga, J. Antonio Padilla, J. Moises |
| author_facet | Servín, Manuel Quiroga, J. Antonio Padilla, J. Moises |
| author_role | aut aut aut |
| author_sort | Servín, Manuel |
| author_variant | m s ms j a q ja jaq j m p jm jmp |
| building | Verbundindex |
| bvnumber | BV044068577 |
| collection | ZDB-30-PAD ZDB-38-ESG |
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| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| illustrated | Illustrated |
| indexdate | 2024-07-10T07:42:42Z |
| institution | BVB |
| isbn | 9783527411528 9783527681082 9783527681105 9783527681099 9783527681075 |
| language | English |
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| spelling | Servín, Manuel aut Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla Weinheim, Germany Wiley-VCH Verlag GmbH & Co. KGaA 2014 © 2014 1 online resource (345 pages) illustrations txt rdacontent c rdamedia cr rdacarrier Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014) Datenverarbeitung Diffraction patterns Data processing Image processing Data processing Optische Messung (DE-588)4121429-8 gnd rswk-swf Interferometrie (DE-588)4027296-5 gnd rswk-swf Metrologie (DE-588)4169749-2 gnd rswk-swf Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf Metrologie (DE-588)4169749-2 s Optische Messtechnik (DE-588)4172667-4 s Optische Messung (DE-588)4121429-8 s Interferometrie (DE-588)4027296-5 s 1\p DE-604 Quiroga, J. Antonio aut Padilla, J. Moises aut Erscheint auch als Druck-Ausgabe Servin, Manuel Fringe pattern analysis for optical metrology : theory, algorithms, and applications 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Servín, Manuel Quiroga, J. Antonio Padilla, J. Moises Fringe pattern analysis for optical metrology theory, algorithms, and applications Datenverarbeitung Diffraction patterns Data processing Image processing Data processing Optische Messung (DE-588)4121429-8 gnd Interferometrie (DE-588)4027296-5 gnd Metrologie (DE-588)4169749-2 gnd Optische Messtechnik (DE-588)4172667-4 gnd |
| subject_GND | (DE-588)4121429-8 (DE-588)4027296-5 (DE-588)4169749-2 (DE-588)4172667-4 |
| title | Fringe pattern analysis for optical metrology theory, algorithms, and applications |
| title_auth | Fringe pattern analysis for optical metrology theory, algorithms, and applications |
| title_exact_search | Fringe pattern analysis for optical metrology theory, algorithms, and applications |
| title_full | Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla |
| title_fullStr | Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla |
| title_full_unstemmed | Fringe pattern analysis for optical metrology theory, algorithms, and applications Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla |
| title_short | Fringe pattern analysis for optical metrology |
| title_sort | fringe pattern analysis for optical metrology theory algorithms and applications |
| title_sub | theory, algorithms, and applications |
| topic | Datenverarbeitung Diffraction patterns Data processing Image processing Data processing Optische Messung (DE-588)4121429-8 gnd Interferometrie (DE-588)4027296-5 gnd Metrologie (DE-588)4169749-2 gnd Optische Messtechnik (DE-588)4172667-4 gnd |
| topic_facet | Datenverarbeitung Diffraction patterns Data processing Image processing Data processing Optische Messung Interferometrie Metrologie Optische Messtechnik |
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