Standards for electronic imaging technologies, devices, and systems: proceedings of a conference held 1-2 February 1996, San Jose, California
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Bellingham, Wash.
Spie Optical Engeneering Press
1996
|
| Schriftenreihe: | Critical reviews of optical science and technology
61 |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | VII, 276 S. graph. Darst. |
| ISBN: | 0819420166 |
Internformat
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| 245 | 1 | 0 | |a Standards for electronic imaging technologies, devices, and systems |b proceedings of a conference held 1-2 February 1996, San Jose, California |c Michael C. Nier ed. |
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Datensatz im Suchindex
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| adam_text | CRITICAL REVIEWS OF OPTICAL SCIENCE AND TECHNOLOGY VOLUME CR61 STANDARDS
FOR ELECTRONIC IMAGING TECHNOLOGIES, DEVICES, AND SYSTEMS MICHAEL C.
NIER EASTMAN KODAK CO. EDITOR PROCEEDINGS OFA CONFERENCE HELD 1-2
FEBRUARY 1996 SAN JOSE, CALIFORNIA SPONSORED BY IS&T*THE SOCIETY FOR
IMAGING SCIENCE AND TECHNOLOGY SPIE*THE INTERNATIONAL SOCIETY FOR
OPTICAL ENGINEERING S P I E O P T I C A L E N G I N E E R I N G P R E
S S A PUBLICATION OF SPIE*THE INTERNATIONAL SOCIETY FOR OPTICAL
ENGINEERING BELLINGHAM, WASHINGTON USA CONTENTS VII PREFAT 3 STANDARDS
FOR IMAGE INPUT DEVICES: REVIEW AND FORECAST D. L. GILBLOM, PACIFIC
PHOTONICS, INC. 29 OVERVIEW OF THE ISO/IEC IMAGE PROCESSING AND
INTERCHANGE STANDARD W. K. PRATT, PIXELSOFT, INC. 57 NATIONAL IMAGERY
TRANSMISSION FORMAT STANDARD (NITFS): A GOVERNMENT/INDUSTRY MODEL K. D.
WHITSON, CENTRAL IMAGERY OFFICE 74 DIGITAL EXCHANGE OF GRAPHIC ARTS
MATERIAH THE ULTIMATE CHALLENGE D. Q. MCDOWELL, EASTMAN KODAK CO. 96
SURVEY OF STANDARDS FOR ELECTRONIC IMAGE DISPLAYS W. A. ROWE, ZENITH
ELECTRONICS CORP. 120 SURVEY OF DEVELOPING ELECTRONIC PHOTOGRAPHY
STANDARDS J. M. HOLM, IMAGING CONSULTANT 155 STANDARDS ON THE PERMANENCE
OF RECORDING MATERIALS P. Z. ADELSTEIN, IMAGE PERMANENCE INSTITUTE 176
IMAGING STANDARDS FOR SMART CARDS R. N. ELLSON, XEROX PALO ALTO RESEARCH
CTR.; L, A. RAY, EASTMAN KODAK CO. 191 UNITED STATES DIGITAL ADVANCED
TELEVISION BROADCASTING STANDARD R. HOPKINS, ADVANCED TELEVISION SYSTEMS
COMMITTEE 217 SURVEY OF STANDARDS FOR IMAGE TELECOMMUNKATIONS S. URBAN,
DELTA INFORMATION SYSTEMS 245 DISTRIBUTED MULTIMEDIA INFORMATION SYSTEMS
J. F. BUFORD, UNIV. OF MASSACHUSETTS/LO-WELL 266 DAVIC: A TOOL TO
ACHIEVE GLOBAL INTEROPERABILITY L. CHIARIGLIONE, CSELT (ITALY)
|
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| indexdate | 2024-07-09T22:40:53Z |
| institution | BVB |
| isbn | 0819420166 |
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| physical | VII, 276 S. graph. Darst. |
| publishDate | 1996 |
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| publisher | Spie Optical Engeneering Press |
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| series | Critical reviews of optical science and technology |
| series2 | Critical reviews of optical science and technology |
| spelling | Standards for electronic imaging technologies, devices, and systems proceedings of a conference held 1-2 February 1996, San Jose, California Michael C. Nier ed. Bellingham, Wash. Spie Optical Engeneering Press 1996 VII, 276 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Critical reviews of optical science and technology 61 Nier, Michael C. edt Critical reviews of optical science and technology 61 (DE-604)BV005490642 61 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=020376723&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Standards for electronic imaging technologies, devices, and systems proceedings of a conference held 1-2 February 1996, San Jose, California Critical reviews of optical science and technology |
| title | Standards for electronic imaging technologies, devices, and systems proceedings of a conference held 1-2 February 1996, San Jose, California |
| title_auth | Standards for electronic imaging technologies, devices, and systems proceedings of a conference held 1-2 February 1996, San Jose, California |
| title_exact_search | Standards for electronic imaging technologies, devices, and systems proceedings of a conference held 1-2 February 1996, San Jose, California |
| title_full | Standards for electronic imaging technologies, devices, and systems proceedings of a conference held 1-2 February 1996, San Jose, California Michael C. Nier ed. |
| title_fullStr | Standards for electronic imaging technologies, devices, and systems proceedings of a conference held 1-2 February 1996, San Jose, California Michael C. Nier ed. |
| title_full_unstemmed | Standards for electronic imaging technologies, devices, and systems proceedings of a conference held 1-2 February 1996, San Jose, California Michael C. Nier ed. |
| title_short | Standards for electronic imaging technologies, devices, and systems |
| title_sort | standards for electronic imaging technologies devices and systems proceedings of a conference held 1 2 february 1996 san jose california |
| title_sub | proceedings of a conference held 1-2 February 1996, San Jose, California |
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| volume_link | (DE-604)BV005490642 |
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