Nanoscale Redox Reaction at Metal/Oxide Interface: A Case Study on Schottky Contact and ReRAM
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Tokyo
Springer Japan
2020
Tokyo Springer |
| Schriftenreihe: | NIMS Monographs
|
| Schlagworte: | |
| Online-Zugang: | BTU01 FFW01 TUM01 Volltext |
| Beschreibung: | 1 Online-Ressource (XI, 89 p. 63 illus., 51 illus. in color) |
| ISBN: | 9784431548508 |
| ISSN: | 2197-8891 |
| DOI: | 10.1007/978-4-431-54850-8 |
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Datensatz im Suchindex
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| author | Nagata, Takahiro |
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| building | Verbundindex |
| bvnumber | BV046747307 |
| classification_tum | CHE 000 |
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| ctrlnum | (ZDB-2-CMS)9784431548508 (OCoLC)1164638311 (DE-599)BVBBV046747307 |
| dewey-full | 620.44 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.44 |
| dewey-search | 620.44 |
| dewey-sort | 3620.44 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Chemie |
| discipline_str_mv | Chemie |
| doi_str_mv | 10.1007/978-4-431-54850-8 |
| format | Electronic eBook |
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| id | DE-604.BV046747307 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T14:41:06Z |
| indexdate | 2024-07-10T08:52:42Z |
| institution | BVB |
| isbn | 9784431548508 |
| issn | 2197-8891 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032157095 |
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| physical | 1 Online-Ressource (XI, 89 p. 63 illus., 51 illus. in color) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2020 |
| publishDate | 2020 |
| publishDateSearch | 2020 |
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| publisher | Springer Japan Springer |
| record_format | marc |
| series2 | NIMS Monographs |
| spelling | Nagata, Takahiro Verfasser aut Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM by Takahiro Nagata Tokyo Springer Japan 2020 Tokyo Springer 1 Online-Ressource (XI, 89 p. 63 illus., 51 illus. in color) txt rdacontent c rdamedia cr rdacarrier NIMS Monographs 2197-8891 Surfaces and Interfaces, Thin Films Semiconductors Electronics and Microelectronics, Instrumentation Nanotechnology Materials—Surfaces Thin films Electronics Microelectronics Erscheint auch als Druck-Ausgabe 978-4-431-54849-2 Erscheint auch als Druck-Ausgabe 978-4-431-54851-5 https://doi.org/10.1007/978-4-431-54850-8 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Nagata, Takahiro Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM Surfaces and Interfaces, Thin Films Semiconductors Electronics and Microelectronics, Instrumentation Nanotechnology Materials—Surfaces Thin films Electronics Microelectronics |
| title | Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM |
| title_auth | Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM |
| title_exact_search | Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM |
| title_exact_search_txtP | Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM |
| title_full | Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM by Takahiro Nagata |
| title_fullStr | Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM by Takahiro Nagata |
| title_full_unstemmed | Nanoscale Redox Reaction at Metal/Oxide Interface A Case Study on Schottky Contact and ReRAM by Takahiro Nagata |
| title_short | Nanoscale Redox Reaction at Metal/Oxide Interface |
| title_sort | nanoscale redox reaction at metal oxide interface a case study on schottky contact and reram |
| title_sub | A Case Study on Schottky Contact and ReRAM |
| topic | Surfaces and Interfaces, Thin Films Semiconductors Electronics and Microelectronics, Instrumentation Nanotechnology Materials—Surfaces Thin films Electronics Microelectronics |
| topic_facet | Surfaces and Interfaces, Thin Films Semiconductors Electronics and Microelectronics, Instrumentation Nanotechnology Materials—Surfaces Thin films Electronics Microelectronics |
| url | https://doi.org/10.1007/978-4-431-54850-8 |
| work_keys_str_mv | AT nagatatakahiro nanoscaleredoxreactionatmetaloxideinterfaceacasestudyonschottkycontactandreram |