Tagungsbericht: München, 11. - 12. Nov. 1982
Gespeichert in:
Hauptverfasser: | , , |
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Körperschaft: | |
Format: | Tagungsbericht Buch |
Sprache: | Undetermined |
Veröffentlicht: |
München
Münchener Messe- u. Ausstellungs-GmbH
1982
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Schlagworte: | |
Beschreibung: | Literaturangaben. - PST: Proceedings. - NE: Murcko, R. M.: Printed circuit reliability exposures due to contaminants. Napp, D. T.: Printed circuit reliability exposures due to contaminants. Ruane, R. E.: Printed circuit reliability exposures due to contaminants |
Beschreibung: | 194 S. graph. Darst. u. Beil. |
Internformat
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700 | 1 | 2 | |a Ruane, R. E. |4 aut |t Printed circuit reliability exposures due to contaminants |
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Datensatz im Suchindex
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any_adam_object | |
author | Murcko, R. M. Napp, D. T. Ruane, R. E. |
author_corporate | International Macroelectronics Conference München |
author_corporate_role | aut |
author_facet | Murcko, R. M. Napp, D. T. Ruane, R. E. International Macroelectronics Conference München |
author_role | aut aut aut |
author_sort | International Macroelectronics Conference München |
author_variant | r m m rm rmm d t n dt dtn r e r re rer |
building | Verbundindex |
bvnumber | BV002316147 |
classification_tum | ELT 230f |
ctrlnum | (OCoLC)630794447 (DE-599)BVBBV002316147 |
discipline | Elektrotechnik |
format | Conference Proceeding Book |
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genre | (DE-588)1071861417 Konferenzschrift 1982 München gnd-content |
genre_facet | Konferenzschrift 1982 München |
id | DE-604.BV002316147 |
illustrated | Illustrated |
indexdate | 2024-07-09T15:43:51Z |
institution | BVB |
institution_GND | (DE-588)1400322-3 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001519752 |
oclc_num | 630794447 |
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owner_facet | DE-91 DE-BY-TUM |
physical | 194 S. graph. Darst. u. Beil. |
publishDate | 1982 |
publishDateSearch | 1982 |
publishDateSort | 1982 |
publisher | Münchener Messe- u. Ausstellungs-GmbH |
record_format | marc |
spelling | International Macroelectronics Conference 1 1982 München Verfasser (DE-588)1400322-3 aut Tagungsbericht München, 11. - 12. Nov. 1982 München Münchener Messe- u. Ausstellungs-GmbH 1982 194 S. graph. Darst. u. Beil. txt rdacontent n rdamedia nc rdacarrier Literaturangaben. - PST: Proceedings. - NE: Murcko, R. M.: Printed circuit reliability exposures due to contaminants. Napp, D. T.: Printed circuit reliability exposures due to contaminants. Ruane, R. E.: Printed circuit reliability exposures due to contaminants Elektronik (DE-588)4014346-6 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1982 München gnd-content Elektronik (DE-588)4014346-6 s DE-604 Murcko, R. M. aut Printed circuit reliability exposures due to contaminants Napp, D. T. aut Printed circuit reliability exposures due to contaminants Ruane, R. E. aut Printed circuit reliability exposures due to contaminants |
spellingShingle | Murcko, R. M. Napp, D. T. Ruane, R. E. Tagungsbericht München, 11. - 12. Nov. 1982 Elektronik (DE-588)4014346-6 gnd |
subject_GND | (DE-588)4014346-6 (DE-588)1071861417 |
title | Tagungsbericht München, 11. - 12. Nov. 1982 |
title_alt | Printed circuit reliability exposures due to contaminants |
title_auth | Tagungsbericht München, 11. - 12. Nov. 1982 |
title_exact_search | Tagungsbericht München, 11. - 12. Nov. 1982 |
title_full | Tagungsbericht München, 11. - 12. Nov. 1982 |
title_fullStr | Tagungsbericht München, 11. - 12. Nov. 1982 |
title_full_unstemmed | Tagungsbericht München, 11. - 12. Nov. 1982 |
title_short | Tagungsbericht |
title_sort | tagungsbericht munchen 11 12 nov 1982 |
title_sub | München, 11. - 12. Nov. 1982 |
topic | Elektronik (DE-588)4014346-6 gnd |
topic_facet | Elektronik Konferenzschrift 1982 München |
work_keys_str_mv | AT internationalmacroelectronicsconferencemunchen tagungsberichtmunchen1112nov1982 AT murckorm tagungsberichtmunchen1112nov1982 AT nappdt tagungsberichtmunchen1112nov1982 AT ruanere tagungsberichtmunchen1112nov1982 |