Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra /:
This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spec...
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Weitere Verfasser: | , |
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Newcastle-upon-Tyne :
Cambridge Scholars Publisher,
2020.
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Schlagworte: | |
Online-Zugang: | Volltext |
Zusammenfassung: | This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi. |
Beschreibung: | 1 online resource (249 pages) |
Bibliographie: | Includes bibliographical references (pages 231-237). |
ISBN: | 1527543897 9781527543898 |
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520 | |a This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi. | ||
588 | 0 | |a Online resource; title from digital title page (viewed on February 25, 2020). | |
504 | |a Includes bibliographical references (pages 231-237). | ||
650 | 0 | |a Fluorescence spectroscopy. |0 http://id.loc.gov/authorities/subjects/sh85049411 | |
650 | 0 | |a X-ray spectroscopy. |0 http://id.loc.gov/authorities/subjects/sh85148744 | |
650 | 0 | |a X-rays |x Diffraction. |0 http://id.loc.gov/authorities/subjects/sh85148750 | |
650 | 0 | |a Materials |x Analysis. |0 http://id.loc.gov/authorities/subjects/sh85082066 | |
650 | 2 | |a Spectrometry, Fluorescence |0 https://id.nlm.nih.gov/mesh/D013050 | |
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650 | 6 | |a Spectroscopie de fluorescence. | |
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650 | 7 | |a X-ray spectroscopy |2 fast | |
650 | 7 | |a X-rays |x Diffraction |2 fast | |
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author | Mikhailov, Igor F. |
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author_facet | Mikhailov, Igor F. Baturin, Alexey A. Mikhailov, Anton I. |
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language | English |
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spelling | Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov. Newcastle-upon-Tyne : Cambridge Scholars Publisher, 2020. ©2020 1 online resource (249 pages) text txt rdacontent computer c rdamedia online resource cr rdacarrier This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physi. Online resource; title from digital title page (viewed on February 25, 2020). Includes bibliographical references (pages 231-237). Fluorescence spectroscopy. http://id.loc.gov/authorities/subjects/sh85049411 X-ray spectroscopy. http://id.loc.gov/authorities/subjects/sh85148744 X-rays Diffraction. http://id.loc.gov/authorities/subjects/sh85148750 Materials Analysis. http://id.loc.gov/authorities/subjects/sh85082066 Spectrometry, Fluorescence https://id.nlm.nih.gov/mesh/D013050 Spectrometry, X-Ray Emission https://id.nlm.nih.gov/mesh/D013052 X-Ray Diffraction https://id.nlm.nih.gov/mesh/D014961 Spectroscopie de fluorescence. Spectroscopie des rayons X. Rayons X Diffraction. Matériaux Analyse. x-ray spectroscopy. aat x-ray diffraction. aat Fluorescence spectroscopy fast Materials Analysis fast X-ray spectroscopy fast X-rays Diffraction fast Baturin, Alexey A. Mikhailov, Anton I. Print version: Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra. Newcastle-upon-Tyne : Cambridge Scholars Publisher, ©2019 9781527542464 FWS01 ZDB-4-EBA FWS_PDA_EBA https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2329686 Volltext |
spellingShingle | Mikhailov, Igor F. Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / Fluorescence spectroscopy. http://id.loc.gov/authorities/subjects/sh85049411 X-ray spectroscopy. http://id.loc.gov/authorities/subjects/sh85148744 X-rays Diffraction. http://id.loc.gov/authorities/subjects/sh85148750 Materials Analysis. http://id.loc.gov/authorities/subjects/sh85082066 Spectrometry, Fluorescence https://id.nlm.nih.gov/mesh/D013050 Spectrometry, X-Ray Emission https://id.nlm.nih.gov/mesh/D013052 X-Ray Diffraction https://id.nlm.nih.gov/mesh/D014961 Spectroscopie de fluorescence. Spectroscopie des rayons X. Rayons X Diffraction. Matériaux Analyse. x-ray spectroscopy. aat x-ray diffraction. aat Fluorescence spectroscopy fast Materials Analysis fast X-ray spectroscopy fast X-rays Diffraction fast |
subject_GND | http://id.loc.gov/authorities/subjects/sh85049411 http://id.loc.gov/authorities/subjects/sh85148744 http://id.loc.gov/authorities/subjects/sh85148750 http://id.loc.gov/authorities/subjects/sh85082066 https://id.nlm.nih.gov/mesh/D013050 https://id.nlm.nih.gov/mesh/D013052 https://id.nlm.nih.gov/mesh/D014961 |
title | Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / |
title_auth | Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / |
title_exact_search | Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / |
title_full | Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov. |
title_fullStr | Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov. |
title_full_unstemmed | Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / by Igor F. Mikhailov, Alexey A. Baturin, and Anton I. Mikhailov. |
title_short | Analyzing Materials Using Joint X-Ray Fluorescence and Diffraction Spectra / |
title_sort | analyzing materials using joint x ray fluorescence and diffraction spectra |
topic | Fluorescence spectroscopy. http://id.loc.gov/authorities/subjects/sh85049411 X-ray spectroscopy. http://id.loc.gov/authorities/subjects/sh85148744 X-rays Diffraction. http://id.loc.gov/authorities/subjects/sh85148750 Materials Analysis. http://id.loc.gov/authorities/subjects/sh85082066 Spectrometry, Fluorescence https://id.nlm.nih.gov/mesh/D013050 Spectrometry, X-Ray Emission https://id.nlm.nih.gov/mesh/D013052 X-Ray Diffraction https://id.nlm.nih.gov/mesh/D014961 Spectroscopie de fluorescence. Spectroscopie des rayons X. Rayons X Diffraction. Matériaux Analyse. x-ray spectroscopy. aat x-ray diffraction. aat Fluorescence spectroscopy fast Materials Analysis fast X-ray spectroscopy fast X-rays Diffraction fast |
topic_facet | Fluorescence spectroscopy. X-ray spectroscopy. X-rays Diffraction. Materials Analysis. Spectrometry, Fluorescence Spectrometry, X-Ray Emission X-Ray Diffraction Spectroscopie de fluorescence. Spectroscopie des rayons X. Rayons X Diffraction. Matériaux Analyse. x-ray spectroscopy. x-ray diffraction. Fluorescence spectroscopy Materials Analysis X-ray spectroscopy X-rays Diffraction |
url | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2329686 |
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