Yield and reliability in microwave circuit and system design:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston u.a.
Artech House
1993
|
| Schriftenreihe: | Artech House microwave library
|
| Schlagworte: | |
| Beschreibung: | XVIII, 276 S. |
| ISBN: | 0890065276 |
Internformat
MARC
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| 041 | 0 | |a eng | |
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| 100 | 1 | |a Meehan, Michael D. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Yield and reliability in microwave circuit and system design |c Michael D. Meehann ; John Purviance |
| 264 | 1 | |a Boston u.a. |b Artech House |c 1993 | |
| 300 | |a XVIII, 276 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Artech House microwave library | |
| 650 | 4 | |a Microwave equipment - Circuits - Design - Use of - Computers | |
| 650 | 4 | |a Computer-aided design | |
| 650 | 4 | |a Engineering design |x Statistical methods | |
| 650 | 4 | |a Microwave integrated circuits |x Design and construction |x Statistical methods | |
| 700 | 1 | |a Purviance, John |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006588043 | ||
Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Meehan, Michael D. Purviance, John |
| author_facet | Meehan, Michael D. Purviance, John |
| author_role | aut aut |
| author_sort | Meehan, Michael D. |
| author_variant | m d m md mdm j p jp |
| building | Verbundindex |
| bvnumber | BV009942919 |
| callnumber-first | T - Technology |
| callnumber-label | TK7876 |
| callnumber-raw | TK7876 |
| callnumber-search | TK7876 |
| callnumber-sort | TK 47876 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4970 |
| classification_tum | ELT 730f |
| ctrlnum | (OCoLC)26552926 (DE-599)BVBBV009942919 |
| dewey-full | 621.381/32 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/32 |
| dewey-search | 621.381/32 |
| dewey-sort | 3621.381 232 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV009942919 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:43:39Z |
| institution | BVB |
| isbn | 0890065276 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006588043 |
| oclc_num | 26552926 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-83 |
| physical | XVIII, 276 S. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Artech House |
| record_format | marc |
| series2 | Artech House microwave library |
| spelling | Meehan, Michael D. Verfasser aut Yield and reliability in microwave circuit and system design Michael D. Meehann ; John Purviance Boston u.a. Artech House 1993 XVIII, 276 S. txt rdacontent n rdamedia nc rdacarrier Artech House microwave library Microwave equipment - Circuits - Design - Use of - Computers Computer-aided design Engineering design Statistical methods Microwave integrated circuits Design and construction Statistical methods Purviance, John Verfasser aut |
| spellingShingle | Meehan, Michael D. Purviance, John Yield and reliability in microwave circuit and system design Microwave equipment - Circuits - Design - Use of - Computers Computer-aided design Engineering design Statistical methods Microwave integrated circuits Design and construction Statistical methods |
| title | Yield and reliability in microwave circuit and system design |
| title_auth | Yield and reliability in microwave circuit and system design |
| title_exact_search | Yield and reliability in microwave circuit and system design |
| title_full | Yield and reliability in microwave circuit and system design Michael D. Meehann ; John Purviance |
| title_fullStr | Yield and reliability in microwave circuit and system design Michael D. Meehann ; John Purviance |
| title_full_unstemmed | Yield and reliability in microwave circuit and system design Michael D. Meehann ; John Purviance |
| title_short | Yield and reliability in microwave circuit and system design |
| title_sort | yield and reliability in microwave circuit and system design |
| topic | Microwave equipment - Circuits - Design - Use of - Computers Computer-aided design Engineering design Statistical methods Microwave integrated circuits Design and construction Statistical methods |
| topic_facet | Microwave equipment - Circuits - Design - Use of - Computers Computer-aided design Engineering design Statistical methods Microwave integrated circuits Design and construction Statistical methods |
| work_keys_str_mv | AT meehanmichaeld yieldandreliabilityinmicrowavecircuitandsystemdesign AT purviancejohn yieldandreliabilityinmicrowavecircuitandsystemdesign |