Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory:
Saved in:
| Main Author: | |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Singapore
Springer Singapore
2020
Singapore Springer |
| Subjects: | |
| Online Access: | BTU01 FFW01 TUM01 Volltext |
| Physical Description: | 1 Online-Ressource (XI, 139 p. 120 illus., 64 illus. in color) |
| ISBN: | 9789811522178 |
| DOI: | 10.1007/978-981-15-2217-8 |
Staff View
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| dewey-hundreds | 600 - Technology (Applied sciences) |
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| id | DE-604.BV046403410 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:43:40Z |
| institution | BVB |
| isbn | 9789811522178 |
| language | English |
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| physical | 1 Online-Ressource (XI, 139 p. 120 illus., 64 illus. in color) |
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| publishDate | 2020 |
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| publisher | Springer Singapore Springer |
| record_format | marc |
| spelling | Lan, Rui Verfasser aut Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory by Rui Lan Singapore Springer Singapore 2020 Singapore Springer 1 Online-Ressource (XI, 139 p. 120 illus., 64 illus. in color) txt rdacontent c rdamedia cr rdacarrier Characterization and Evaluation of Materials Optical and Electronic Materials Semiconductors Materials Engineering Electronic Circuits and Devices Phase Transitions and Multiphase Systems Materials science Optical materials Electronic materials Engineering—Materials Electronic circuits Phase transitions (Statistical physics) Erscheint auch als Druck-Ausgabe 978-981-152-216-1 Erscheint auch als Druck-Ausgabe 978-981-152-218-5 Erscheint auch als Druck-Ausgabe 978-981-152-219-2 https://doi.org/10.1007/978-981-15-2217-8 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Lan, Rui Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory Characterization and Evaluation of Materials Optical and Electronic Materials Semiconductors Materials Engineering Electronic Circuits and Devices Phase Transitions and Multiphase Systems Materials science Optical materials Electronic materials Engineering—Materials Electronic circuits Phase transitions (Statistical physics) |
| title | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |
| title_auth | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |
| title_exact_search | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |
| title_full | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory by Rui Lan |
| title_fullStr | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory by Rui Lan |
| title_full_unstemmed | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory by Rui Lan |
| title_short | Thermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory |
| title_sort | thermophysical properties and measuring technique of ge sb te alloys for phase change memory |
| topic | Characterization and Evaluation of Materials Optical and Electronic Materials Semiconductors Materials Engineering Electronic Circuits and Devices Phase Transitions and Multiphase Systems Materials science Optical materials Electronic materials Engineering—Materials Electronic circuits Phase transitions (Statistical physics) |
| topic_facet | Characterization and Evaluation of Materials Optical and Electronic Materials Semiconductors Materials Engineering Electronic Circuits and Devices Phase Transitions and Multiphase Systems Materials science Optical materials Electronic materials Engineering—Materials Electronic circuits Phase transitions (Statistical physics) |
| url | https://doi.org/10.1007/978-981-15-2217-8 |
| work_keys_str_mv | AT lanrui thermophysicalpropertiesandmeasuringtechniqueofgesbtealloysforphasechangememory |