Influence of temperature on microelectronics and system reliability:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton [u.a.]
CRC Press
1997
|
| Schriftenreihe: | The electronic packaging series
|
| Schlagworte: | |
| Beschreibung: | [20], 307 S. Ill., graph. Darst. |
| ISBN: | 0849394503 |
Internformat
MARC
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| 100 | 1 | |a Lall, Pradeep |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Influence of temperature on microelectronics and system reliability |c Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim |
| 264 | 1 | |a Boca Raton [u.a.] |b CRC Press |c 1997 | |
| 300 | |a [20], 307 S. |b Ill., graph. Darst. | ||
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| 650 | 0 | 7 | |a Temperatur |0 (DE-588)4059427-0 |2 gnd |9 rswk-swf |
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| 700 | 1 | |a Pecht, Michael G. |e Verfasser |4 aut | |
| 700 | 1 | |a Hakim, Edward B. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007727019 | ||
Datensatz im Suchindex
| _version_ | 1804126004526972928 |
|---|---|
| any_adam_object | |
| author | Lall, Pradeep Pecht, Michael G. Hakim, Edward B. |
| author_facet | Lall, Pradeep Pecht, Michael G. Hakim, Edward B. |
| author_role | aut aut aut |
| author_sort | Lall, Pradeep |
| author_variant | p l pl m g p mg mgp e b h eb ebh |
| building | Verbundindex |
| bvnumber | BV011485091 |
| classification_rvk | ZN 4040 |
| ctrlnum | (OCoLC)247520360 (DE-599)BVBBV011485091 |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV011485091 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:10:34Z |
| institution | BVB |
| isbn | 0849394503 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007727019 |
| oclc_num | 247520360 |
| open_access_boolean | |
| owner | DE-29T DE-703 DE-858 DE-83 |
| owner_facet | DE-29T DE-703 DE-858 DE-83 |
| physical | [20], 307 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | CRC Press |
| record_format | marc |
| series2 | The electronic packaging series |
| spelling | Lall, Pradeep Verfasser aut Influence of temperature on microelectronics and system reliability Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim Boca Raton [u.a.] CRC Press 1997 [20], 307 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier The electronic packaging series Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Temperatur (DE-588)4059427-0 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 s Zuverlässigkeit (DE-588)4059245-5 s Temperatur (DE-588)4059427-0 s DE-604 Pecht, Michael G. Verfasser aut Hakim, Edward B. Verfasser aut |
| spellingShingle | Lall, Pradeep Pecht, Michael G. Hakim, Edward B. Influence of temperature on microelectronics and system reliability Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd Temperatur (DE-588)4059427-0 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4039207-7 (DE-588)4059427-0 |
| title | Influence of temperature on microelectronics and system reliability |
| title_auth | Influence of temperature on microelectronics and system reliability |
| title_exact_search | Influence of temperature on microelectronics and system reliability |
| title_full | Influence of temperature on microelectronics and system reliability Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim |
| title_fullStr | Influence of temperature on microelectronics and system reliability Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim |
| title_full_unstemmed | Influence of temperature on microelectronics and system reliability Pradeep Lall ; Michael G. Pecht ; Edward B. Hakim |
| title_short | Influence of temperature on microelectronics and system reliability |
| title_sort | influence of temperature on microelectronics and system reliability |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd Temperatur (DE-588)4059427-0 gnd |
| topic_facet | Zuverlässigkeit Mikroelektronik Temperatur |
| work_keys_str_mv | AT lallpradeep influenceoftemperatureonmicroelectronicsandsystemreliability AT pechtmichaelg influenceoftemperatureonmicroelectronicsandsystemreliability AT hakimedwardb influenceoftemperatureonmicroelectronicsandsystemreliability |