Fault diagnosis of analog integrated circuits:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Dordrecht
Springer
2005
|
| Schriftenreihe: | Frontiers in electronic testing
30 |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | IX, 182 S. graph. Darst. |
| ISBN: | 038725742X 0387257438 9780387257426 9780387257433 |
Internformat
MARC
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| 245 | 1 | 0 | |a Fault diagnosis of analog integrated circuits |c by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha |
| 264 | 1 | |a Dordrecht |b Springer |c 2005 | |
| 300 | |a IX, 182 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Frontiers in electronic testing |v 30 | |
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Circuits analogiques - Défauts | |
| 650 | 4 | |a Circuits analogiques - Essais | |
| 650 | 4 | |a Circuits intégrés - Défauts | |
| 650 | 4 | |a Circuits intégrés - Essais | |
| 650 | 4 | |a Semiconducteurs - Défauts | |
| 650 | 4 | |a Semiconducteurs - Essais | |
| 650 | 4 | |a Linear integrated circuits | |
| 650 | 4 | |a Linear integrated circuits |x Testing | |
| 650 | 0 | 7 | |a Analoge integrierte Schaltung |0 (DE-588)4112519-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Fehlererkennung |0 (DE-588)4133764-5 |2 gnd |9 rswk-swf |
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Datensatz im Suchindex
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| author | Kabisatpathy, Prithviraj Barua, Alok Sinha, Satyabroto |
| author_facet | Kabisatpathy, Prithviraj Barua, Alok Sinha, Satyabroto |
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| author_sort | Kabisatpathy, Prithviraj |
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| bvnumber | BV021989878 |
| callnumber-first | T - Technology |
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| callnumber-raw | TK7874.654 |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)61766498 (DE-599)BVBBV021989878 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| discipline_str_mv | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV021989878 |
| illustrated | Illustrated |
| index_date | 2024-07-02T16:10:31Z |
| indexdate | 2024-07-09T20:48:52Z |
| institution | BVB |
| isbn | 038725742X 0387257438 9780387257426 9780387257433 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-015204692 |
| oclc_num | 61766498 |
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| owner_facet | DE-706 DE-29T |
| physical | IX, 182 S. graph. Darst. |
| publishDate | 2005 |
| publishDateSearch | 2005 |
| publishDateSort | 2005 |
| publisher | Springer |
| record_format | marc |
| series | Frontiers in electronic testing |
| series2 | Frontiers in electronic testing |
| spelling | Kabisatpathy, Prithviraj Verfasser aut Fault diagnosis of analog integrated circuits by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha Dordrecht Springer 2005 IX, 182 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Frontiers in electronic testing 30 Literaturangaben Circuits analogiques - Défauts Circuits analogiques - Essais Circuits intégrés - Défauts Circuits intégrés - Essais Semiconducteurs - Défauts Semiconducteurs - Essais Linear integrated circuits Linear integrated circuits Testing Analoge integrierte Schaltung (DE-588)4112519-8 gnd rswk-swf Fehlererkennung (DE-588)4133764-5 gnd rswk-swf Analoge integrierte Schaltung (DE-588)4112519-8 s DE-604 Fehlererkennung (DE-588)4133764-5 s Barua, Alok Verfasser aut Sinha, Satyabroto Verfasser aut Frontiers in electronic testing 30 (DE-604)BV010836129 30 |
| spellingShingle | Kabisatpathy, Prithviraj Barua, Alok Sinha, Satyabroto Fault diagnosis of analog integrated circuits Frontiers in electronic testing Circuits analogiques - Défauts Circuits analogiques - Essais Circuits intégrés - Défauts Circuits intégrés - Essais Semiconducteurs - Défauts Semiconducteurs - Essais Linear integrated circuits Linear integrated circuits Testing Analoge integrierte Schaltung (DE-588)4112519-8 gnd Fehlererkennung (DE-588)4133764-5 gnd |
| subject_GND | (DE-588)4112519-8 (DE-588)4133764-5 |
| title | Fault diagnosis of analog integrated circuits |
| title_auth | Fault diagnosis of analog integrated circuits |
| title_exact_search | Fault diagnosis of analog integrated circuits |
| title_exact_search_txtP | Fault diagnosis of analog integrated circuits |
| title_full | Fault diagnosis of analog integrated circuits by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha |
| title_fullStr | Fault diagnosis of analog integrated circuits by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha |
| title_full_unstemmed | Fault diagnosis of analog integrated circuits by Prithviraj Kabisatpathy, Alok Barua and Satyabroto Sinha |
| title_short | Fault diagnosis of analog integrated circuits |
| title_sort | fault diagnosis of analog integrated circuits |
| topic | Circuits analogiques - Défauts Circuits analogiques - Essais Circuits intégrés - Défauts Circuits intégrés - Essais Semiconducteurs - Défauts Semiconducteurs - Essais Linear integrated circuits Linear integrated circuits Testing Analoge integrierte Schaltung (DE-588)4112519-8 gnd Fehlererkennung (DE-588)4133764-5 gnd |
| topic_facet | Circuits analogiques - Défauts Circuits analogiques - Essais Circuits intégrés - Défauts Circuits intégrés - Essais Semiconducteurs - Défauts Semiconducteurs - Essais Linear integrated circuits Linear integrated circuits Testing Analoge integrierte Schaltung Fehlererkennung |
| volume_link | (DE-604)BV010836129 |
| work_keys_str_mv | AT kabisatpathyprithviraj faultdiagnosisofanalogintegratedcircuits AT baruaalok faultdiagnosisofanalogintegratedcircuits AT sinhasatyabroto faultdiagnosisofanalogintegratedcircuits |