Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Abschlussarbeit Buch |
| Sprache: | English |
| Veröffentlicht: |
1990
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| Schlagworte: | |
| Beschreibung: | 185 S. Ill., graph. Darst. |
Internformat
MARC
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| 003 | DE-604 | ||
| 005 | 20161103 | ||
| 007 | t | ||
| 008 | 950210s1990 ad|| m||| 00||| eng d | ||
| 035 | |a (OCoLC)916445784 | ||
| 035 | |a (DE-599)BVBBV024397960 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
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| 100 | 1 | |a Jong, Alan F. de |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |c by Alan Frank de Jong |
| 264 | 1 | |c 1990 | |
| 300 | |a 185 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 502 | |a Delft, Univ., Diss., 1990 | ||
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Bildverstehen |0 (DE-588)4202022-0 |2 gnd |9 rswk-swf |
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| 689 | 0 | 2 | |a Bildverstehen |0 (DE-588)4202022-0 |D s |
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Datensatz im Suchindex
| _version_ | 1804140362531340288 |
|---|---|
| any_adam_object | |
| author | Jong, Alan F. de |
| author_facet | Jong, Alan F. de |
| author_role | aut |
| author_sort | Jong, Alan F. de |
| author_variant | a f d j afd afdj |
| building | Verbundindex |
| bvnumber | BV024397960 |
| ctrlnum | (OCoLC)916445784 (DE-599)BVBBV024397960 |
| format | Thesis Book |
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| illustrated | Illustrated |
| indexdate | 2024-07-09T21:58:46Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-018376807 |
| oclc_num | 916445784 |
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| physical | 185 S. Ill., graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| record_format | marc |
| spelling | Jong, Alan F. de Verfasser aut Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces by Alan Frank de Jong 1990 185 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Delft, Univ., Diss., 1990 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Bildverstehen (DE-588)4202022-0 gnd rswk-swf Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Halbleiterschicht (DE-588)4158812-5 s Bildverstehen (DE-588)4202022-0 s DE-604 |
| spellingShingle | Jong, Alan F. de Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Bildverstehen (DE-588)4202022-0 gnd Halbleiterschicht (DE-588)4158812-5 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4202022-0 (DE-588)4158812-5 (DE-588)4113937-9 |
| title | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| title_auth | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| title_exact_search | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| title_full | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces by Alan Frank de Jong |
| title_fullStr | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces by Alan Frank de Jong |
| title_full_unstemmed | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces by Alan Frank de Jong |
| title_short | Image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| title_sort | image interpretation for transmission electron microscopy of thin semiconductor layers and interfaces |
| topic | Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Bildverstehen (DE-588)4202022-0 gnd Halbleiterschicht (DE-588)4158812-5 gnd |
| topic_facet | Durchstrahlungselektronenmikroskopie Bildverstehen Halbleiterschicht Hochschulschrift |
| work_keys_str_mv | AT jongalanfde imageinterpretationfortransmissionelectronmicroscopyofthinsemiconductorlayersandinterfaces |