Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications:
Gespeichert in:
1. Verfasser: | |
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Format: | Abschlussarbeit Buch |
Sprache: | English |
Veröffentlicht: |
Aachen
Shaker
1996
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Ausgabe: | Als Ms. gedr. |
Schriftenreihe: | Berichte aus der Halbleitertechnik
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Schlagworte: | |
Beschreibung: | VI, 202 S. Ill., zahlr. graph. Darst. |
ISBN: | 3826512286 |
Internformat
MARC
LEADER | 00000nam a2200000zc 4500 | ||
---|---|---|---|
001 | BV023782642 | ||
003 | DE-604 | ||
005 | 20070313000000.0 | ||
007 | t | ||
008 | 001107s1996 ad|| m||| 00||| eng d | ||
020 | |a 3826512286 |9 3-8265-1228-6 | ||
035 | |a (OCoLC)915867631 | ||
035 | |a (DE-599)BVBBV023782642 | ||
040 | |a DE-604 |b ger | ||
041 | 0 | |a eng | |
049 | |a DE-634 | ||
100 | 1 | |a Joachim, Hans-Oliver |e Verfasser |4 aut | |
245 | 1 | 0 | |a Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications |c Hans-Oliver Joachim |
250 | |a Als Ms. gedr. | ||
264 | 1 | |a Aachen |b Shaker |c 1996 | |
300 | |a VI, 202 S. |b Ill., zahlr. graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Berichte aus der Halbleitertechnik | |
502 | |a Zugl.: Osaka, Univ., Diss., 1995 | ||
650 | 0 | 7 | |a SOI-Technik |0 (DE-588)4128029-5 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a MOS-FET |0 (DE-588)4207266-9 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a CMOS |0 (DE-588)4010319-5 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)4113937-9 |a Hochschulschrift |2 gnd-content | |
689 | 0 | 0 | |a MOS-FET |0 (DE-588)4207266-9 |D s |
689 | 0 | 1 | |a SOI-Technik |0 (DE-588)4128029-5 |D s |
689 | 0 | 2 | |a VLSI |0 (DE-588)4117388-0 |D s |
689 | 0 | 3 | |a CMOS |0 (DE-588)4010319-5 |D s |
689 | 0 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-017424853 |
Datensatz im Suchindex
_version_ | 1804138974083547136 |
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any_adam_object | |
author | Joachim, Hans-Oliver |
author_facet | Joachim, Hans-Oliver |
author_role | aut |
author_sort | Joachim, Hans-Oliver |
author_variant | h o j hoj |
building | Verbundindex |
bvnumber | BV023782642 |
ctrlnum | (OCoLC)915867631 (DE-599)BVBBV023782642 |
edition | Als Ms. gedr. |
format | Thesis Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01434nam a2200409zc 4500</leader><controlfield tag="001">BV023782642</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20070313000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">001107s1996 ad|| m||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3826512286</subfield><subfield code="9">3-8265-1228-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)915867631</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV023782642</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Joachim, Hans-Oliver</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications</subfield><subfield code="c">Hans-Oliver Joachim</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Als Ms. gedr.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Aachen</subfield><subfield code="b">Shaker</subfield><subfield code="c">1996</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 202 S.</subfield><subfield code="b">Ill., zahlr. graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Berichte aus der Halbleitertechnik</subfield></datafield><datafield tag="502" ind1=" " ind2=" "><subfield code="a">Zugl.: Osaka, Univ., Diss., 1995</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">SOI-Technik</subfield><subfield code="0">(DE-588)4128029-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">MOS-FET</subfield><subfield code="0">(DE-588)4207266-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)4113937-9</subfield><subfield code="a">Hochschulschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">MOS-FET</subfield><subfield code="0">(DE-588)4207266-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">SOI-Technik</subfield><subfield code="0">(DE-588)4128029-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">CMOS</subfield><subfield code="0">(DE-588)4010319-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-017424853</subfield></datafield></record></collection> |
genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
genre_facet | Hochschulschrift |
id | DE-604.BV023782642 |
illustrated | Illustrated |
indexdate | 2024-07-09T21:36:42Z |
institution | BVB |
isbn | 3826512286 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-017424853 |
oclc_num | 915867631 |
open_access_boolean | |
owner | DE-634 |
owner_facet | DE-634 |
physical | VI, 202 S. Ill., zahlr. graph. Darst. |
publishDate | 1996 |
publishDateSearch | 1996 |
publishDateSort | 1996 |
publisher | Shaker |
record_format | marc |
series2 | Berichte aus der Halbleitertechnik |
spelling | Joachim, Hans-Oliver Verfasser aut Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications Hans-Oliver Joachim Als Ms. gedr. Aachen Shaker 1996 VI, 202 S. Ill., zahlr. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Berichte aus der Halbleitertechnik Zugl.: Osaka, Univ., Diss., 1995 SOI-Technik (DE-588)4128029-5 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf MOS-FET (DE-588)4207266-9 gnd rswk-swf CMOS (DE-588)4010319-5 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content MOS-FET (DE-588)4207266-9 s SOI-Technik (DE-588)4128029-5 s VLSI (DE-588)4117388-0 s CMOS (DE-588)4010319-5 s DE-604 |
spellingShingle | Joachim, Hans-Oliver Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications SOI-Technik (DE-588)4128029-5 gnd VLSI (DE-588)4117388-0 gnd MOS-FET (DE-588)4207266-9 gnd CMOS (DE-588)4010319-5 gnd |
subject_GND | (DE-588)4128029-5 (DE-588)4117388-0 (DE-588)4207266-9 (DE-588)4010319-5 (DE-588)4113937-9 |
title | Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications |
title_auth | Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications |
title_exact_search | Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications |
title_full | Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications Hans-Oliver Joachim |
title_fullStr | Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications Hans-Oliver Joachim |
title_full_unstemmed | Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications Hans-Oliver Joachim |
title_short | Investigation on the short channel silicon on insulator (SOI) MOSFET towards 0.1 [my]m gate length for future VLSI applications |
title_sort | investigation on the short channel silicon on insulator soi mosfet towards 0 1 my m gate length for future vlsi applications |
topic | SOI-Technik (DE-588)4128029-5 gnd VLSI (DE-588)4117388-0 gnd MOS-FET (DE-588)4207266-9 gnd CMOS (DE-588)4010319-5 gnd |
topic_facet | SOI-Technik VLSI MOS-FET CMOS Hochschulschrift |
work_keys_str_mv | AT joachimhansoliver investigationontheshortchannelsilicononinsulatorsoimosfettowards01mymgatelengthforfuturevlsiapplications |