Hybrid microcircuit reliability data:
Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent c...
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Oxford New York
Pergamon Press
1976
|
| Schlagworte: | |
| Online-Zugang: | FAW01 Volltext |
| Zusammenfassung: | Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use |
| Beschreibung: | 1 online resource (208 pages) |
| ISBN: | 9781483138275 1483138275 0080205356 9780080205359 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044390822 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 170630s1976 |||| o||u| ||||||eng d | ||
| 020 | |a 9781483138275 |9 978-1-4831-3827-5 | ||
| 020 | |a 1483138275 |9 1-4831-3827-5 | ||
| 020 | |a 0080205356 |9 0-08-020535-6 | ||
| 020 | |a 9780080205359 |9 978-0-08-020535-9 | ||
| 035 | |a (ZDB-33-ESD)ocn881847531 | ||
| 035 | |a (OCoLC)881847531 | ||
| 035 | |a (DE-599)BVBBV044390822 | ||
| 040 | |a DE-604 |b ger |e rda | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-1046 | ||
| 082 | 0 | |a 621.381/73 |2 22 | |
| 110 | 2 | |a IIT Research Institute |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Hybrid microcircuit reliability data |c prepared by IIT Research Institute |
| 264 | 1 | |a Oxford |a New York |b Pergamon Press |c 1976 | |
| 300 | |a 1 online resource (208 pages) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 520 | |a Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use | ||
| 650 | 7 | |a TECHNOLOGY & ENGINEERING / Mechanical |2 bisacsh | |
| 650 | 7 | |a Hybrid integrated circuits / Reliability |2 fast | |
| 650 | 7 | |a Hybridschaltung |2 swd | |
| 650 | 4 | |a Hybrid integrated circuits |x Reliability | |
| 650 | 0 | 7 | |a Hybridschaltung |0 (DE-588)4026281-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |8 1\p |0 (DE-588)4148875-1 |a Datensammlung |2 gnd-content | |
| 689 | 0 | 0 | |a Hybridschaltung |0 (DE-588)4026281-9 |D s |
| 689 | 0 | |8 2\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |a IIT Research Institute |t Hybrid microcircuit reliability data |z 0080205356 |
| 856 | 4 | 0 | |u http://www.sciencedirect.com/science/book/9780080205359 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-33-ESD | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-029793044 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u http://www.sciencedirect.com/science/book/9780080205359 |l FAW01 |p ZDB-33-ESD |q FAW_PDA_ESD |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804177663441502208 |
|---|---|
| any_adam_object | |
| author_corporate | IIT Research Institute |
| author_corporate_role | aut |
| author_facet | IIT Research Institute |
| author_sort | IIT Research Institute |
| building | Verbundindex |
| bvnumber | BV044390822 |
| collection | ZDB-33-ESD |
| ctrlnum | (ZDB-33-ESD)ocn881847531 (OCoLC)881847531 (DE-599)BVBBV044390822 |
| dewey-full | 621.381/73 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/73 |
| dewey-search | 621.381/73 |
| dewey-sort | 3621.381 273 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02514nmm a2200493zc 4500</leader><controlfield tag="001">BV044390822</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">170630s1976 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781483138275</subfield><subfield code="9">978-1-4831-3827-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1483138275</subfield><subfield code="9">1-4831-3827-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0080205356</subfield><subfield code="9">0-08-020535-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780080205359</subfield><subfield code="9">978-0-08-020535-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-33-ESD)ocn881847531</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)881847531</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044390822</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-1046</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381/73</subfield><subfield code="2">22</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">IIT Research Institute</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Hybrid microcircuit reliability data</subfield><subfield code="c">prepared by IIT Research Institute</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford</subfield><subfield code="a">New York</subfield><subfield code="b">Pergamon Press</subfield><subfield code="c">1976</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 online resource (208 pages)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">TECHNOLOGY & ENGINEERING / Mechanical</subfield><subfield code="2">bisacsh</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Hybrid integrated circuits / Reliability</subfield><subfield code="2">fast</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Hybridschaltung</subfield><subfield code="2">swd</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Hybrid integrated circuits</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hybridschaltung</subfield><subfield code="0">(DE-588)4026281-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="8">1\p</subfield><subfield code="0">(DE-588)4148875-1</subfield><subfield code="a">Datensammlung</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Hybridschaltung</subfield><subfield code="0">(DE-588)4026281-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="a">IIT Research Institute</subfield><subfield code="t">Hybrid microcircuit reliability data</subfield><subfield code="z">0080205356</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">http://www.sciencedirect.com/science/book/9780080205359</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-33-ESD</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-029793044</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">http://www.sciencedirect.com/science/book/9780080205359</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-33-ESD</subfield><subfield code="q">FAW_PDA_ESD</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| genre | 1\p (DE-588)4148875-1 Datensammlung gnd-content |
| genre_facet | Datensammlung |
| id | DE-604.BV044390822 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T07:51:39Z |
| institution | BVB |
| isbn | 9781483138275 1483138275 0080205356 9780080205359 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029793044 |
| oclc_num | 881847531 |
| open_access_boolean | |
| owner | DE-1046 |
| owner_facet | DE-1046 |
| physical | 1 online resource (208 pages) |
| psigel | ZDB-33-ESD ZDB-33-ESD FAW_PDA_ESD |
| publishDate | 1976 |
| publishDateSearch | 1976 |
| publishDateSort | 1976 |
| publisher | Pergamon Press |
| record_format | marc |
| spelling | IIT Research Institute Verfasser aut Hybrid microcircuit reliability data prepared by IIT Research Institute Oxford New York Pergamon Press 1976 1 online resource (208 pages) txt rdacontent c rdamedia cr rdacarrier Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use TECHNOLOGY & ENGINEERING / Mechanical bisacsh Hybrid integrated circuits / Reliability fast Hybridschaltung swd Hybrid integrated circuits Reliability Hybridschaltung (DE-588)4026281-9 gnd rswk-swf 1\p (DE-588)4148875-1 Datensammlung gnd-content Hybridschaltung (DE-588)4026281-9 s 2\p DE-604 Erscheint auch als Druck-Ausgabe IIT Research Institute Hybrid microcircuit reliability data 0080205356 http://www.sciencedirect.com/science/book/9780080205359 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Hybrid microcircuit reliability data TECHNOLOGY & ENGINEERING / Mechanical bisacsh Hybrid integrated circuits / Reliability fast Hybridschaltung swd Hybrid integrated circuits Reliability Hybridschaltung (DE-588)4026281-9 gnd |
| subject_GND | (DE-588)4026281-9 (DE-588)4148875-1 |
| title | Hybrid microcircuit reliability data |
| title_auth | Hybrid microcircuit reliability data |
| title_exact_search | Hybrid microcircuit reliability data |
| title_full | Hybrid microcircuit reliability data prepared by IIT Research Institute |
| title_fullStr | Hybrid microcircuit reliability data prepared by IIT Research Institute |
| title_full_unstemmed | Hybrid microcircuit reliability data prepared by IIT Research Institute |
| title_short | Hybrid microcircuit reliability data |
| title_sort | hybrid microcircuit reliability data |
| topic | TECHNOLOGY & ENGINEERING / Mechanical bisacsh Hybrid integrated circuits / Reliability fast Hybridschaltung swd Hybrid integrated circuits Reliability Hybridschaltung (DE-588)4026281-9 gnd |
| topic_facet | TECHNOLOGY & ENGINEERING / Mechanical Hybrid integrated circuits / Reliability Hybridschaltung Hybrid integrated circuits Reliability Datensammlung |
| url | http://www.sciencedirect.com/science/book/9780080205359 |
| work_keys_str_mv | AT iitresearchinstitute hybridmicrocircuitreliabilitydata |