High resolution electron microscopy for materials science:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | German English Japanese |
| Veröffentlicht: |
Tokyo [u.a.]
Springer
1998
|
| Schlagworte: | |
| Beschreibung: | Translation is based on the Japanese original |
| Beschreibung: | IX, 190 S. Ill., graph. Darst. |
| ISBN: | 4431702342 |
Internformat
MARC
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| 003 | DE-604 | ||
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| 007 | t| | ||
| 008 | 981110s1998 gw ad|| |||| 00||| ger d | ||
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| 100 | 1 | |a Shindo, Daisuke |d 1953- |e Verfasser |0 (DE-588)120559463 |4 aut | |
| 240 | 1 | 0 | |a Zairyo-hyoka-no-tameno-kobunkaino-denshi-kenbikyou-ho |
| 245 | 1 | 0 | |a High resolution electron microscopy for materials science |c D. Shindo ; K. Hiraga |
| 264 | 1 | |a Tokyo [u.a.] |b Springer |c 1998 | |
| 300 | |a IX, 190 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a Translation is based on the Japanese original | ||
| 650 | 7 | |a Elektronenmicroscopie |2 gtt | |
| 650 | 7 | |a HREM |2 gtt | |
| 650 | 4 | |a High resolution electron microscopy | |
| 650 | 4 | |a Materials |x Microscopy | |
| 650 | 0 | 7 | |a Hochauflösendes Verfahren |0 (DE-588)4287503-1 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 1 | |a Hochauflösendes Verfahren |0 (DE-588)4287503-1 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Hiraga, Kenji |d 1939- |e Verfasser |0 (DE-588)120559501 |4 aut | |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-008314968 | |
Datensatz im Suchindex
| _version_ | 1821501331119013888 |
|---|---|
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| author | Shindo, Daisuke 1953- Hiraga, Kenji 1939- |
| author_GND | (DE-588)120559463 (DE-588)120559501 |
| author_facet | Shindo, Daisuke 1953- Hiraga, Kenji 1939- |
| author_role | aut aut |
| author_sort | Shindo, Daisuke 1953- |
| author_variant | d s ds k h kh |
| building | Verbundindex |
| bvnumber | BV012268339 |
| callnumber-first | T - Technology |
| callnumber-label | TA417 |
| callnumber-raw | TA417.23 |
| callnumber-search | TA417.23 |
| callnumber-sort | TA 3417.23 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UH 6300 ZM 3850 |
| ctrlnum | (OCoLC)39085372 (DE-599)BVBBV012268339 |
| dewey-full | 620.1/1299 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/1299 |
| dewey-search | 620.1/1299 |
| dewey-sort | 3620.1 41299 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
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| id | DE-604.BV012268339 |
| illustrated | Illustrated |
| indexdate | 2025-01-17T13:03:56Z |
| institution | BVB |
| isbn | 4431702342 |
| language | German English Japanese |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008314968 |
| oclc_num | 39085372 |
| open_access_boolean | |
| owner | DE-20 DE-703 DE-634 DE-83 DE-11 |
| owner_facet | DE-20 DE-703 DE-634 DE-83 DE-11 |
| physical | IX, 190 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Springer |
| record_format | marc |
| spelling | Shindo, Daisuke 1953- Verfasser (DE-588)120559463 aut Zairyo-hyoka-no-tameno-kobunkaino-denshi-kenbikyou-ho High resolution electron microscopy for materials science D. Shindo ; K. Hiraga Tokyo [u.a.] Springer 1998 IX, 190 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Translation is based on the Japanese original Elektronenmicroscopie gtt HREM gtt High resolution electron microscopy Materials Microscopy Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s DE-604 Hiraga, Kenji 1939- Verfasser (DE-588)120559501 aut |
| spellingShingle | Shindo, Daisuke 1953- Hiraga, Kenji 1939- High resolution electron microscopy for materials science Elektronenmicroscopie gtt HREM gtt High resolution electron microscopy Materials Microscopy Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4287503-1 (DE-588)4014327-2 |
| title | High resolution electron microscopy for materials science |
| title_alt | Zairyo-hyoka-no-tameno-kobunkaino-denshi-kenbikyou-ho |
| title_auth | High resolution electron microscopy for materials science |
| title_exact_search | High resolution electron microscopy for materials science |
| title_full | High resolution electron microscopy for materials science D. Shindo ; K. Hiraga |
| title_fullStr | High resolution electron microscopy for materials science D. Shindo ; K. Hiraga |
| title_full_unstemmed | High resolution electron microscopy for materials science D. Shindo ; K. Hiraga |
| title_short | High resolution electron microscopy for materials science |
| title_sort | high resolution electron microscopy for materials science |
| topic | Elektronenmicroscopie gtt HREM gtt High resolution electron microscopy Materials Microscopy Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Elektronenmicroscopie HREM High resolution electron microscopy Materials Microscopy Hochauflösendes Verfahren Elektronenmikroskopie |
| work_keys_str_mv | AT shindodaisuke zairyohyokanotamenokobunkainodenshikenbikyouho AT hiragakenji zairyohyokanotamenokobunkainodenshikenbikyouho AT shindodaisuke highresolutionelectronmicroscopyformaterialsscience AT hiragakenji highresolutionelectronmicroscopyformaterialsscience |