Current noise in n-channel Si-MOSFET's at cryogenic temperatures: (met een samenvatting in het Nederlands)
Saved in:
| Main Author: | |
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| Format: | Thesis Book |
| Language: | English |
| Published: |
1987
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| Subjects: | |
| Item Description: | Utrecht, Rijksuniv., Diss. - PST: Stroomruis in n-kanaals Si-MOSFET's bij cryogene temperaturen |
| Physical Description: | 134 S. graph. Darst. |
Staff View
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| 245 | 1 | 0 | |a Current noise in n-channel Si-MOSFET's at cryogenic temperatures |b (met een samenvatting in het Nederlands) |c door Emile Alexander Hendriks |
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| 300 | |a 134 S. |b graph. Darst. | ||
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| 500 | |a Utrecht, Rijksuniv., Diss. - PST: Stroomruis in n-kanaals Si-MOSFET's bij cryogene temperaturen | ||
| 502 | |a Utrecht, Rijksuniv., Diss., 1987 | ||
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Record in the Search Index
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| author | Hendriks, Emile A. |
| author_facet | Hendriks, Emile A. |
| author_role | aut |
| author_sort | Hendriks, Emile A. |
| author_variant | e a h ea eah |
| building | Verbundindex |
| bvnumber | BV001042288 |
| ctrlnum | (OCoLC)615384272 (DE-599)BVBBV001042288 |
| format | Thesis Book |
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| genre | (DE-588)4113937-9 Hochschulschrift gnd-content |
| genre_facet | Hochschulschrift |
| id | DE-604.BV001042288 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:22:58Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-000630123 |
| oclc_num | 615384272 |
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| owner_facet | DE-19 DE-BY-UBM DE-355 DE-BY-UBR DE-29T DE-188 |
| physical | 134 S. graph. Darst. |
| publishDate | 1987 |
| publishDateSearch | 1987 |
| publishDateSort | 1987 |
| record_format | marc |
| spelling | Hendriks, Emile A. Verfasser aut Current noise in n-channel Si-MOSFET's at cryogenic temperatures (met een samenvatting in het Nederlands) door Emile Alexander Hendriks 1987 134 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Utrecht, Rijksuniv., Diss. - PST: Stroomruis in n-kanaals Si-MOSFET's bij cryogene temperaturen Utrecht, Rijksuniv., Diss., 1987 Funkelrauschen (DE-588)4485771-8 gnd rswk-swf Messung (DE-588)4038852-9 gnd rswk-swf MOS-FET (DE-588)4207266-9 gnd rswk-swf Rauschen (DE-588)4048606-0 gnd rswk-swf Tieftemperaturverhalten (DE-588)4232597-3 gnd rswk-swf Tieftemperatur (DE-588)4134801-1 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content MOS-FET (DE-588)4207266-9 s Funkelrauschen (DE-588)4485771-8 s Messung (DE-588)4038852-9 s Tieftemperatur (DE-588)4134801-1 s DE-604 Rauschen (DE-588)4048606-0 s Tieftemperaturverhalten (DE-588)4232597-3 s |
| spellingShingle | Hendriks, Emile A. Current noise in n-channel Si-MOSFET's at cryogenic temperatures (met een samenvatting in het Nederlands) Funkelrauschen (DE-588)4485771-8 gnd Messung (DE-588)4038852-9 gnd MOS-FET (DE-588)4207266-9 gnd Rauschen (DE-588)4048606-0 gnd Tieftemperaturverhalten (DE-588)4232597-3 gnd Tieftemperatur (DE-588)4134801-1 gnd |
| subject_GND | (DE-588)4485771-8 (DE-588)4038852-9 (DE-588)4207266-9 (DE-588)4048606-0 (DE-588)4232597-3 (DE-588)4134801-1 (DE-588)4113937-9 |
| title | Current noise in n-channel Si-MOSFET's at cryogenic temperatures (met een samenvatting in het Nederlands) |
| title_auth | Current noise in n-channel Si-MOSFET's at cryogenic temperatures (met een samenvatting in het Nederlands) |
| title_exact_search | Current noise in n-channel Si-MOSFET's at cryogenic temperatures (met een samenvatting in het Nederlands) |
| title_full | Current noise in n-channel Si-MOSFET's at cryogenic temperatures (met een samenvatting in het Nederlands) door Emile Alexander Hendriks |
| title_fullStr | Current noise in n-channel Si-MOSFET's at cryogenic temperatures (met een samenvatting in het Nederlands) door Emile Alexander Hendriks |
| title_full_unstemmed | Current noise in n-channel Si-MOSFET's at cryogenic temperatures (met een samenvatting in het Nederlands) door Emile Alexander Hendriks |
| title_short | Current noise in n-channel Si-MOSFET's at cryogenic temperatures |
| title_sort | current noise in n channel si mosfet s at cryogenic temperatures met een samenvatting in het nederlands |
| title_sub | (met een samenvatting in het Nederlands) |
| topic | Funkelrauschen (DE-588)4485771-8 gnd Messung (DE-588)4038852-9 gnd MOS-FET (DE-588)4207266-9 gnd Rauschen (DE-588)4048606-0 gnd Tieftemperaturverhalten (DE-588)4232597-3 gnd Tieftemperatur (DE-588)4134801-1 gnd |
| topic_facet | Funkelrauschen Messung MOS-FET Rauschen Tieftemperaturverhalten Tieftemperatur Hochschulschrift |
| work_keys_str_mv | AT hendriksemilea currentnoiseinnchannelsimosfetsatcryogenictemperaturesmeteensamenvattinginhetnederlands |