Automatic testing and evaluation of digital integrated circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Reston, Virginia
Reston Publ.
1981
|
| Schlagworte: | |
| Beschreibung: | XVII, 236 S. Ill., graph. Darst. |
| ISBN: | 0835902560 |
Internformat
MARC
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| 100 | 1 | |a Healy, James T. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Automatic testing and evaluation of digital integrated circuits |
| 264 | 1 | |a Reston, Virginia |b Reston Publ. |c 1981 | |
| 300 | |a XVII, 236 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Automatic test equipment | |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Healy, James T. |
| author_facet | Healy, James T. |
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| author_sort | Healy, James T. |
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| building | Verbundindex |
| bvnumber | BV002003372 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
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| ctrlnum | (OCoLC)6602724 (DE-599)BVBBV002003372 |
| dewey-full | 621.381/73/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/73/0287 |
| dewey-search | 621.381/73/0287 |
| dewey-sort | 3621.381 273 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV002003372 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T15:38:43Z |
| institution | BVB |
| isbn | 0835902560 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-001306865 |
| oclc_num | 6602724 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-898 DE-BY-UBR DE-83 |
| owner_facet | DE-91 DE-BY-TUM DE-898 DE-BY-UBR DE-83 |
| physical | XVII, 236 S. Ill., graph. Darst. |
| psigel | TUB-nveb |
| publishDate | 1981 |
| publishDateSearch | 1981 |
| publishDateSort | 1981 |
| publisher | Reston Publ. |
| record_format | marc |
| spelling | Healy, James T. Verfasser aut Automatic testing and evaluation of digital integrated circuits Reston, Virginia Reston Publ. 1981 XVII, 236 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Automatic test equipment Digital integrated circuits Testing Prüfung (DE-588)4047609-1 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 s Prüfung (DE-588)4047609-1 s DE-604 |
| spellingShingle | Healy, James T. Automatic testing and evaluation of digital integrated circuits Automatic test equipment Digital integrated circuits Testing Prüfung (DE-588)4047609-1 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| subject_GND | (DE-588)4047609-1 (DE-588)4113313-4 |
| title | Automatic testing and evaluation of digital integrated circuits |
| title_auth | Automatic testing and evaluation of digital integrated circuits |
| title_exact_search | Automatic testing and evaluation of digital integrated circuits |
| title_full | Automatic testing and evaluation of digital integrated circuits |
| title_fullStr | Automatic testing and evaluation of digital integrated circuits |
| title_full_unstemmed | Automatic testing and evaluation of digital integrated circuits |
| title_short | Automatic testing and evaluation of digital integrated circuits |
| title_sort | automatic testing and evaluation of digital integrated circuits |
| topic | Automatic test equipment Digital integrated circuits Testing Prüfung (DE-588)4047609-1 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| topic_facet | Automatic test equipment Digital integrated circuits Testing Prüfung Digitale integrierte Schaltung |
| work_keys_str_mv | AT healyjamest automatictestingandevaluationofdigitalintegratedcircuits |