IDDQ testing of VLSI circuits: tutorial f
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Paris
1995
|
| Schriftenreihe: | Tutorial notes
|
| Schlagworte: | |
| Beschreibung: | Getr. Zählung Ill., graph. Darst. |
Internformat
MARC
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| 003 | DE-604 | ||
| 005 | 19961213 | ||
| 007 | t | ||
| 008 | 950830s1995 ad|| |||| 10||| und d | ||
| 035 | |a (OCoLC)634226935 | ||
| 035 | |a (DE-599)BVBBV010363692 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
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| 100 | 1 | |a Hawkins, Chuck |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a IDDQ testing of VLSI circuits |b tutorial f |c Chuck Hawkins ; Keith Baker. The European Design and Test Conference 1995 |
| 246 | 1 | 3 | |a Tutorial F |
| 264 | 1 | |a Paris |c 1995 | |
| 300 | |a Getr. Zählung |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 490 | 0 | |a Tutorial notes | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Baker, Keith |d 1945- |e Verfasser |0 (DE-588)1157982778 |4 aut | |
| 711 | 2 | |a European Design and Test Conference |d 1995 |c Paris |j Sonstige |0 (DE-588)5131049-1 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-006898646 | ||
Datensatz im Suchindex
| _version_ | 1804124786314444800 |
|---|---|
| any_adam_object | |
| author | Hawkins, Chuck Baker, Keith 1945- |
| author_GND | (DE-588)1157982778 |
| author_facet | Hawkins, Chuck Baker, Keith 1945- |
| author_role | aut aut |
| author_sort | Hawkins, Chuck |
| author_variant | c h ch k b kb |
| building | Verbundindex |
| bvnumber | BV010363692 |
| classification_tum | ELT 359f |
| ctrlnum | (OCoLC)634226935 (DE-599)BVBBV010363692 |
| discipline | Elektrotechnik |
| format | Conference Proceeding Book |
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| illustrated | Illustrated |
| indexdate | 2024-07-09T17:51:12Z |
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| physical | Getr. Zählung Ill., graph. Darst. |
| publishDate | 1995 |
| publishDateSearch | 1995 |
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| series2 | Tutorial notes |
| spelling | Hawkins, Chuck Verfasser aut IDDQ testing of VLSI circuits tutorial f Chuck Hawkins ; Keith Baker. The European Design and Test Conference 1995 Tutorial F Paris 1995 Getr. Zählung Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Tutorial notes (DE-588)1071861417 Konferenzschrift gnd-content Baker, Keith 1945- Verfasser (DE-588)1157982778 aut European Design and Test Conference 1995 Paris Sonstige (DE-588)5131049-1 oth |
| spellingShingle | Hawkins, Chuck Baker, Keith 1945- IDDQ testing of VLSI circuits tutorial f |
| subject_GND | (DE-588)1071861417 |
| title | IDDQ testing of VLSI circuits tutorial f |
| title_alt | Tutorial F |
| title_auth | IDDQ testing of VLSI circuits tutorial f |
| title_exact_search | IDDQ testing of VLSI circuits tutorial f |
| title_full | IDDQ testing of VLSI circuits tutorial f Chuck Hawkins ; Keith Baker. The European Design and Test Conference 1995 |
| title_fullStr | IDDQ testing of VLSI circuits tutorial f Chuck Hawkins ; Keith Baker. The European Design and Test Conference 1995 |
| title_full_unstemmed | IDDQ testing of VLSI circuits tutorial f Chuck Hawkins ; Keith Baker. The European Design and Test Conference 1995 |
| title_short | IDDQ testing of VLSI circuits |
| title_sort | iddq testing of vlsi circuits tutorial f |
| title_sub | tutorial f |
| topic_facet | Konferenzschrift |
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