MEMS Reliability:
Gespeichert in:
Hauptverfasser: | , , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Boston, MA
Springer US
2011
|
Schriftenreihe: | MEMS Reference Shelf
|
Schlagworte: | |
Online-Zugang: | TUM01 Volltext |
Beschreibung: | 1 Online-Ressource |
ISBN: | 9781441960184 |
DOI: | 10.1007/978-1-4419-6018-4 |
Internformat
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Datensatz im Suchindex
DE-BY-FWS_katkey | 435270 |
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author | Hartzell, Allyson L. da Silva, Mark G. Shea, Herbert R. |
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doi_str_mv | 10.1007/978-1-4419-6018-4 |
format | Electronic eBook |
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id | DE-604.BV040124444 |
illustrated | Not Illustrated |
indexdate | 2024-08-01T11:46:37Z |
institution | BVB |
isbn | 9781441960184 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-024981730 |
oclc_num | 724468001 |
open_access_boolean | |
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physical | 1 Online-Ressource |
psigel | ZDB-2-ENG ZDB-30-PQE ZDB-30-PQE TUM_Einzelkauf |
publishDate | 2011 |
publishDateSearch | 2011 |
publishDateSort | 2011 |
publisher | Springer US |
record_format | marc |
series2 | MEMS Reference Shelf |
spellingShingle | Hartzell, Allyson L. da Silva, Mark G. Shea, Herbert R. MEMS Reliability Ingenieurwissenschaften Engineering Electronics Electronics and Microelectronics, Instrumentation |
title | MEMS Reliability |
title_auth | MEMS Reliability |
title_exact_search | MEMS Reliability |
title_full | MEMS Reliability by Allyson L. Hartzell, Mark G. da Silva, Herbert R. Shea |
title_fullStr | MEMS Reliability by Allyson L. Hartzell, Mark G. da Silva, Herbert R. Shea |
title_full_unstemmed | MEMS Reliability by Allyson L. Hartzell, Mark G. da Silva, Herbert R. Shea |
title_short | MEMS Reliability |
title_sort | mems reliability |
topic | Ingenieurwissenschaften Engineering Electronics Electronics and Microelectronics, Instrumentation |
topic_facet | Ingenieurwissenschaften Engineering Electronics Electronics and Microelectronics, Instrumentation |
url | https://doi.org/10.1007/978-1-4419-6018-4 |
work_keys_str_mv | AT hartzellallysonl memsreliability AT dasilvamarkg memsreliability AT sheaherbertr memsreliability |