Spectrophotometry: accurate measurement of optical properties of materials
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2014
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| Schriftenreihe: | Experimental methods in the physical sciences
46 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XXV, 533 S. Ill., graph. Darst., Kt. 24 cm |
| ISBN: | 9780123860224 0123860229 |
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| 245 | 1 | 0 | |a Spectrophotometry |b accurate measurement of optical properties of materials |c ed. by Thomas A. Germer ... |
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 2014 | |
| 300 | |a XXV, 533 S. |b Ill., graph. Darst., Kt. |c 24 cm | ||
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Datensatz im Suchindex
| _version_ | 1804152463190654976 |
|---|---|
| adam_text | Titel: Spectrophotometry
Autor: Germer, Thomas A
Jahr: 2014
Contents
Contributors xv
Volumes in Series xvii
Preface xxi
1. Introduction 1
Thomas A. Germer, Joanne C. Zwinkels,
and Benjamin K. Tsai
1.1 Opening Remarks 1
1.2 Uncertainties 4
1.3 Overview 8
References 9
2. Theoretical Concepts in Spectrophotometric
Measurements 11
Thomas A. Germer, Joanne C. Zwinkels,
and Benjamin K. Tsai
2.1 Introduction 12
2.2 Radiometric Quantities 13
2.2.1 Nonspectral Quantities 13
2.2.2 Spectral Quantities 18
2.2.3 Spectrally Weighted Quantities 19
2.3 Relationship Between Radiometric and
Electromagnetic Quantities 20
2.3.1 Plane Waves and Irradiance 23
2.3.2 Spherical Waves and Intensity 24
2.3.3 Fourier Expansion and Radiance 25
2.4 The Spectrophotometric Quantities 26
2.4.1 Generalized Scattering Functions 27
2.4.2 Bidirectional Reflectance Distribution Function 28
2.4.3 Reflectance and Transmittance 30
2.4.4 Two Ideal Bidirectional Reflectance
Distribution Functions 32
2.4.5 Absorptance 34
2.4.6 Fluorescence: Bispectral Luminescent Radiance Factor 36
2.4.7 Emittance and the Kirchhoff Relationship 38
2.5 Polarization 39
2.6 Reflection and Transmission from Flat Surfaces 43
2.6.1 Snell s Law of Refraction 43
2.6.2 Fresnel Reflection 44
v
GD
Contents
2.6.3 Thin Films
2.6.4 Thick Films
2.7 Diffuse Scattering
2.7.1 Volume Scattering: Theory of Kubelka and Munk
2.7.2 Roughness: Facet Scattering Model
2.7.3 Roughness: First-Order Vector Perturbation Theory
References
3. Dispersive Methods
Arnold A. Gaertner, Howard W. Yoon,
and Thomas A. Germer
3.1 Introduction
3.2 General Description
3.2.1 Bandpass Function
3.2.2 Gratings
3.2.3 Prisms
3.2.4 Resolving Power
3.3 Spectral Analyzer Design
3.3.1 Monochromator Design
3.3.2 Polychromator Design
3.4 Wavelength Calibration
3.5 Stray Light
3.6 Optical Radiation Sources
3.7 Optical Radiation Detectors
References
4. Fourier Transform Methods
Simon G. Kaplan and Manuel A. Quijada
4.1 Introduction: Ideal Michelson Interferometer
4.2 Real Fourier Transform Spectrometers
4.2.1 Finite Scan Length and Source Size: Spectral
Resolution
4.2.2 Sampling the Interferogram: Spectral Bandwidth
4.2.3 Phase Error and Phase Correction
4.2.4 FTS Versus Dispersive Instruments
4.2.5 FTS Design Considerations
4.2.6 Instrument Design Examples
4.3 Sources of Uncertainty and Their Reduction
4.3.1 Noise
4.3.2 Interferometer Alignment Drift
4.3.3 Phase Error
4.3.4 Detector Nonlinearity
4.3.5 Interreflections
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Contents
4.3.6 Nonsource Emission
4.3.7 Beam Geometry Errors
4.3.8 Polarization Effects
4.3.9 Stray Light
4.3.10 Atmospheric Absorption
4.3.11 Wavenumber Uncertainly
4.4 Measurement Applications
4.4.1 Measurement of Transmittance and Reflectance
4.4.2 Measurement of Refractive Index
4.4.3 Assessment of the Accuracy of FTS Measurements
4.5 Recommendations for Accurate FTS Measurements
4.5.1 Matching Instrument to Measurement Requirements
4.5.2 Instrument Software and Data Handling
4.5.3 Maintenance of Measurement Traceability
References
5. Regular Reflectance and Transmittance
Peter A. van Nijnatten
5.1 Introduction
5.2 Relevant Background Information
5.2.1 Measurement Geometry
5.2.2 Measurement Equation
5.2.3 Evaluation of Measurement Uncertainty
5.2.4 The Role of Integrating Spheres
5.2.5 Avoiding Spectral Artifacts
5.3 Measurements Near-Normal Incidence
5.3.1 Typical Configurations for Near-Normal Reflection
Measurements
5.3.2 Measuring the Transmittance and Reflectance
of Coated Substrates
5.3.3 Measuring Very Low Reflectance Materials
5.3.4 Measuring Specular Reflectance with an FTIR
5.3.5 Tools for Absolute Reflectance and Transmittance
Measurements
5.4 Measurements at Oblique Incidence
5.4.1 Relevant Issues
5.4.2 Directional Transmittance Measurements
5.4.3 Relative Directional Reflection Measurements
5.4.4 Absolute Directional Reflection Measurements
5.5 Measuring the Reflectance of Highly Reflecting
Materials
5.5.1 VW Method
5.5.2 IV Method
References
GD
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yjij ^ Contents
6. Diffuse Reflectance and Transmittance 179
Andreas Hope
6.1 Introduction 180
6.2 Measurands 182
6.2.1 Reflectance 182
6.2.2 Reflectance Factor 182
6.2.3 Radiance Factor 183
6.2.4 Transmittance 183
6.2.5 Relationship Between Reflectance, Transmittance, and
Absorptance 184
6.3 Notation of Diffuse Reflection Geometries 184
6.3.1 Recommended Integrating Sphere Geometries 186
6.4 Integrating Spheres 187
6.4.1 Historic Information 189
6.4.2 Setup 190
6.4.3 Construction Principles 190
6.4.4 Internal Coating Materials 191
6.4.5 Homogeneity 192
6.5 Absolute Sphere Methods for Measuring Diffuse Reflection 193
6.5.1 Basic Considerations 193
6.5.2 Method of Taylor (First Taylor) and Benford 195
6.5.3 Method of Taylor (Third Taylor) 197
6.5.4 Method of Sharp-Little 198
6.5.5 Method of van den Akker 199
6.5.6 Method of Korte Schmidt 200
6.5.7 Coblentz Sphere 202
6.5.8 Goniometric Method 203
6.6 Diffuse Reflection Standards 203
6.6.1 Requirements 204
6.6.2 Common Diffuse Reflection Standards 205
6.6.3 Fluorescence of Diffuse Reflection Standards 210
6.6.4 Handling Recommendations 211
6.7 Relative Sphere Methods for Measuring
Diffuse Reflection 212
6.8 Diffuse Transmittance Measurements 214
References 216
7. Spectral Fluorescence Measurements 221
Joanne C. Zwinkels, Paul C. DeRose, and James E. Leland
7.1 Introduction 222
7.1.1 Fluorescence Measurement Applications 223
7.2 Fundamental Concepts and Terminology 224
7.2.1 Quantities Common to Analytical and Colorimetric
Applications 225
7.2.2 Specific to Analytical Applications 230
Contents (ix )
7.2.3 Specific to Colorimetric Applications 232
7.3 Measurement of Fluorescence Characteristics 238
7.3.1 Bispectral Measurements 238
7.3.2 Abridged Measurements 239
7.4 General Instrument Design and Measurement Considerations 240
7.4.1 Instrument Components 240
7.4.2 Spectral Measurement Methods 241
7.4.3 General Considerations and Good Laboratory Practices 243
7.5 Specialized Instrument Designs and Measurement Methods 244
7.5.1 Analytical Applications 244
7.5.2 Colorimetric Applications 247
7.5.3 Quantum Yield Measurements 256
7.6 Instrument Characteristics That Impact Spectral
Fluorescence Measurements 260
7.6.1 Spectral Characteristics 260
7.6.2 Detector Nonlinearity 264
7.6.3 Polarization Effects 266
7.6.4 Stray Light 269
7.6.5 Instrument Lineshape 270
7.6.6 Sampling Effects 271
7.7 Sample Characteristics That Impact Fluorescence
Measurements 274
7.7.1 Optical Density 274
7.7.2 Solvent/Matrix Properties 275
7.7.3 Refractive Index 275
7.7.4 Impurities 276
7.7.5 Luminescence Lifetime 277
7.7.6 Scattering 277
7.8 Standards for Spectral Fluorescence Measurements 278
7.8.1 Correcting Relative Excitation and Emission Spectra 278
7.8.2 Intensity Verification Standards 283
7.8.3 Fluorescent Color Standards 284
7.8.4 Quantum Yield Standards 286
References 287
8. Angle-Resolved Diffuse Reflectance and
Transmittance 291
Thomas A. Cermer, John C. Stover, and Sven Schroder
8.1 Introduction 292
8.2 Reference-Free Measurement Methods 294
8.2.1 The Over-Illumination Method 295
8.2.2 The Under-lllumination Method 297
8.3 Instrument Characterization 301
8.3.1 The Instrument Signature 301
8.3.2 Noise-Equivalent BRDF 303
Contents
8.3.3 Profile of Illumination Spot 303
8.3.4 The Field of View 304
8.3.5 Detector Location Sensitivity 304
8.3.6 Linearity 304
8.4 Goniometer Designs 304
8.4.1 In-Plane Scatterometer Designs 304
8.4.2 Out-of-Plane Scatterometer Designs 305
8.4.3 Multichannel Systems 309
8.5 Uncertainty Analysis 311
8.6 Normalization Schemes 315
8.6.1 Relative Normalization 315
8.6.2 Specular Normalization 316
8.7 Special Conditions or Considerations 316
8.7.1 Ultraviolet 316
8.7.2 Infrared 316
8.7.3 Polarization 316
8.7.4 Transmission Measurements 317
8.8 Applications 317
8.8.1 Pressed PTFE 318
8.8.2 Integration of BRDF 318
8.8.3 Diffuse Black Paint 321
8.8.4 Characterization of Surface Roughness 322
8.8.5 Scattering Characterization of Anisotropic Surface
Structures 325
8.8.6 Predicting Out-of-Plane BRDF from In-Plane BRDF 326
References 328
9. Spectral Emissivity Measurements 333
Hiromichi Watanabe, juntaro Ishii, Hidenobu
Wakabayashi, Tomoyuki Kumano, and Leonard Hanssen
9.1 Introduction 334
9.2 Measurement Methods 336
9.3 Spectral Emissivity Measurements Near-Ambient
Temperature 338
9.3.1 Measurement Apparatus Based on the Blackbody
Comparison Method 338
9.3.2 Calibration of the System Response 340
9.3.3 Correction for Reflected Radiance of the
Surroundings 342
9.3.4 Traceability and Uncertainty of Spectral Emissivity
Measurements 342
9.4 Spectral Emissivity and Reflectance Measurements of
Oxidized Metals 345
9.4.1 A Broad-Spectral-Range High-Speed Spectrophotometer
System 345
Contents
9.5 Spectral Emissivity Measurements of Molten Metals at
High Temperatures 349
9.5.1 Importance of Molten Metal Emissivity Data 349
9.5.2 Spectral Emissivity Measurements Based on
Containerless Techniques 351
9.6 Spectral Emissivity Measurements of Ceramics 357
References 362
10. Color and Appearance 367
Maria E. Nadal, Dave Wyble, and Clarence J. Zarobila
10.1 Introduction 367
10.2 Spectral Attributes—Color 368
10.2.1 Definition 368
10.2.2 CIE System 370
10.2.3 Metamerism 376
10.2.4 Chromaticity Coordinates and Color Spaces 377
10.2.5 Color Difference Metrics 380
10.3 Color-Measuring Instruments 383
10.3.1 Geometric Considerations 385
10.3.2 Source Considerations 389
10.3.3 Detection and Signal Processing Considerations 390
10.3.4 Uncertainties 392
10.4 Gonioapparent Materials 394
10.5 Geometrical Attributes 396
10.5.1 Specular Gloss 397
10.5.2 Haze 400
10.5.3 Distinctness of Image 403
References 404
11. The Use of Spectrophotometry in the Pharmaceutical
Industry 409
John P. Hammond
11.1 Introduction 410
11.2 Introduction to the Pharmaceutical Industry 410
11.2.1 Process Analytical Technology 411
11.2.2 Quality by Design 411
11.2.3 Product Development Cycle 412
11.2.4 Discovery Research 412
11.3 Quality System for the Analytical Laboratory 414
11.3.1 Consideration for Quality Systems in Data Quality
Assurance/Control 414
11.4 UV and Visible Spectrophotometry 419
11.4.1 Qualification of UV and Visible Spectrophotometers 421
11.4.2 Validation and Verification 430
11.4.3 Pharmaceutical Applications (UV-vis) 430
Contents
11.5 NIR Spectrometry 433
11.5.1 Factors That Affect NIR Spectra 434
11.5.2 Instrumentation 435
11.5.3 Qualification of NIR Instruments 435
11.5.4 Method Validation 438
11.5.5 Pharmaceutical Applications (NIR) 439
11.6 Mid-IR Spectrometry 440
11.6.1 Qualification of IR Spectrophotometers 441
11.6.2 Validation and Verification 445
11.6.3 Pharmaceutical Applications (MiddR) 445
11.7 Fluorescence Spectrometry 446
11.7.1 Qualification of Fluorescence Instruments 447
11.7.2 Validation and Verification 453
11.7.3 Pharmaceutical Applications (Fluorescence) 454
11.8 Where Next? 454
References 455
12. Spectrophotometry Applications: Remote Sensing 457
Carol J. Bruegge, Roger Davies, Florian M. Schwandner,
and Felix C. Seidel
12.1 Introduction 458
12.2 Measurement of Atmospheric Carbon Dioxide 458
12.3 The Remote Sensing of Clouds in the Earth s Atmosphere 464
12.3.1 Why Clouds? 465
12.3.2 The Spectrophotometry of Clouds: Forward Problem 466
12.3.3 The Spectrophotometry of Clouds: Inverse Problems 468
12.3.4 The Nakajima and King Approach for Plane-Parallel
Clouds 468
12.3.5 The Optical Depth of Thin Clouds in General 469
12.3.6 The Optical Depth of Thick Clouds 469
12.3.7 Cloud Altitude 469
12.3.8 Cloud Motion Vectors 470
12.4 The Retrieval of Snow Properties 470
12.4.1 Snow-Covered Area 471
12.4.2 Snow-Grain Size 471
12.4.3 Snow Albedo 472
12.4.4 Radiative Forcing of Light-Absorbing
Impurities in Snow 473
12.4.5 Benefits of Imaging Spectroscopy in
Combination with Other Observations for
Snow Remote Sensing 474
12.5 Volcanic Unrest 475
12.5.1 Early Remote Sensing Methods 475
12.5.2 Applications and Relevance 475
12.5.3 Imaging of Volcanic Landforms,
Eruption Detection, and Degassing 477
Contents
12.6 Calibration
12.7 Summary
Acknowledgments
References
13. Microspectrophotometry
Paul C. Martin and Michael B. Eyring
13.1 Introduction
13.2 Microspectrophotometer Instrument Design and Construction
13.2.1 The Microscope
13.2.2 The Spectrophotometer
13.2.3 Computer Interface and Software Control
13.2.4 MSP System Capabilities
13.3 Using the MSP System
13.4 Current Applications of MSP in Industry and Research
13.4.1 Forensic Applications of MSP
13.4.2 Microspot Thin-Film Thickness
13.4.3 Graphene and Carbon Nanotubes
13.4.4 ITeavy Element Chemistry
13.4.5 Lignins
13.4.6 Cellulosic Nanomaterials
13.4.7 The MSP Analysis of Gemstones and
Glass Fragments
13.4.8 Identifying Protein Crystals
13.4.9 Gold and Silver Nanomaterials
13.5 Conclusion
References
GiD
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Index
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| spelling | Spectrophotometry accurate measurement of optical properties of materials ed. by Thomas A. Germer ... Amsterdam [u.a.] Elsevier 2014 XXV, 533 S. Ill., graph. Darst., Kt. 24 cm txt rdacontent n rdamedia nc rdacarrier Experimental methods in the physical sciences 46 Spektralfotometrie (DE-588)4182170-1 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Spektralfotometrie (DE-588)4182170-1 s DE-604 Germer, Thomas A. edt Experimental methods in the physical sciences 46 (DE-604)BV010604537 46 HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=027479432&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Spectrophotometry accurate measurement of optical properties of materials Experimental methods in the physical sciences Spektralfotometrie (DE-588)4182170-1 gnd |
| subject_GND | (DE-588)4182170-1 (DE-588)4143413-4 |
| title | Spectrophotometry accurate measurement of optical properties of materials |
| title_auth | Spectrophotometry accurate measurement of optical properties of materials |
| title_exact_search | Spectrophotometry accurate measurement of optical properties of materials |
| title_full | Spectrophotometry accurate measurement of optical properties of materials ed. by Thomas A. Germer ... |
| title_fullStr | Spectrophotometry accurate measurement of optical properties of materials ed. by Thomas A. Germer ... |
| title_full_unstemmed | Spectrophotometry accurate measurement of optical properties of materials ed. by Thomas A. Germer ... |
| title_short | Spectrophotometry |
| title_sort | spectrophotometry accurate measurement of optical properties of materials |
| title_sub | accurate measurement of optical properties of materials |
| topic | Spektralfotometrie (DE-588)4182170-1 gnd |
| topic_facet | Spektralfotometrie Aufsatzsammlung |
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