Addressing process variations at the microarchitecture and system level:

This monograph surveys emerging statistical design techniques targeted towards the analysis and mitigation of process variation at the system level design abstraction, for both conventional planar and emerging 3D integrated circuits

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Bibliographische Detailangaben
Hauptverfasser: Garg, Siddharth (VerfasserIn), Marculescu, Diana (VerfasserIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: Boston Now Publishers 2012
Schriftenreihe:Foundations and trends in electronic design automation Vol. 6, no. 3 (2012)
Schlagworte:
Online-Zugang:TUM01
Zusammenfassung:This monograph surveys emerging statistical design techniques targeted towards the analysis and mitigation of process variation at the system level design abstraction, for both conventional planar and emerging 3D integrated circuits
Beschreibung:Description based on publisher supplied metadata and other sources
Beschreibung:1 online resource (77 pages)
ISBN:9781601986597

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