X-ray and image analysis in electron microscopy:
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Berlin
Pro Business
2017
|
| Ausgabe: | 3rd edition |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis Inhaltsverzeichnis |
| Beschreibung: | 118 Seiten Illustrationen, Diagramme 29 cm, 580 g 1 ungezähltes Blatt |
| ISBN: | 9783864606748 3864606748 |
Internformat
MARC
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| 100 | 1 | |a Friel, John J. |4 aut | |
| 245 | 1 | 0 | |a X-ray and image analysis in electron microscopy |c John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz) |
| 250 | |a 3rd edition | ||
| 264 | 1 | |a Berlin |b Pro Business |c 2017 | |
| 300 | |a 118 Seiten |b Illustrationen, Diagramme |c 29 cm, 580 g |e 1 ungezähltes Blatt | ||
| 336 | |b txt |2 rdacontent | ||
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| 653 | |a SDD | ||
| 653 | |a chemical | ||
| 653 | |a microanalysis | ||
| 653 | |a microprobe | ||
| 653 | |a nanoanalysis | ||
| 653 | |a nanoscience | ||
| 653 | |a spectrometry | ||
| 689 | 0 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
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| 700 | 1 | |a Terborg, Ralf |d 1969- |e Verfasser |0 (DE-588)123088771 |4 aut | |
| 700 | 1 | |a Langner, Stefan |e Verfasser |4 aut | |
| 700 | 1 | |a Salge, Tobias |e Verfasser |4 aut | |
| 700 | 1 | |a Rohde, Martin |e Verfasser |4 aut | |
| 700 | 1 | |a Berlin, Jana |e Verfasser |4 aut | |
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| 999 | |a oai:aleph.bib-bvb.de:BVB01-029890228 | ||
Datensatz im Suchindex
| _version_ | 1804177834584834048 |
|---|---|
| adam_text | TABLE OF CONTENTS
I. INTRODUCTION
10
OTHER MICROANALYTICAL TECHNIQUES
10
BRIEF HISTORY
12
II. ELECTRON-SPECIMEN INTERACTION AND X-RAY GENERATION
14
ELECTRON SCATTERING
14
IONIZATION CROSS SECTION
14
CHARACTERISTIC X-RAYS
15
MOSELEY S LAW
16
FLUORESCENCE YIELD
18
RELATIVE LINE INTENSITIES
18
CONTINUUM GENERATION
20
ABSORPTION
21
FLUORESCENCE
23
III. X-RAY MEASUREMENT
24
ENERGY DISPERSIVE SPECTROSCOPY
24
GENERAL D
ESCRIPTION
24
TYPES OF EDS D
ETECTORS
24
LITHIUM
-DRIFTED SILICON
24
SILICON D
RIFT D
ETECTOR
26
M
ICROCALORIM
ETER
28
D
ETECTOR COM
PARISON
29
XFIASHFLAT Q
UAD
29
SIGNAL PROCESSING
30
ANALOG SIGNAL PROCESSING
30
DIGITAL PROCESSING
30
HYBRID SIGNAL PROCESSING
32
D
ETECTOR RESOLUTION
32
C
OUNT RATE VS. RESOLUTION
34
Q
UANTUM EFFICIENCY
34
C
OLLECTION EFFICIENCY
35
SOLID A
NGLE
35
SPECTRAL A
RTIFACTS
36
WAVELENGTH DISPERSIVE SPECTROSCOPY
36
GENERAL D
ESCRIPTION
36
S
PECTROM
ETER RESOLUTION
39
COMPARISON OF DETECTION TECHNIQUES
39
SPATIAL RESOLUTION
40
RANGE IN O
THER INSTRUM
ENTS
42
IV. QUALITATIVE ANALYSIS
44
CALIBRATION
44
AUTOMATIC IDENTIFICATION
44
STEP-BY-STEP IDENTIFICATION
45
OVERLAPS
46
SUMMARY OF QUALITATIVE ANALYSIS
46
V. QUANTITATIVE ANALYSIS
47
BACKGROUND SUBTRACTION AND DECONVOLUTION
47
BACKGROUND SUBTRACTION
47
D
ECONVOLUTION
48
TAKE-OFF A
NGLE
50
VARIABLE Z
51
STANDARDLESS ANALYSIS
52
S
PECTROM
ETER EFFICIENCY
52
MATRIX CORRECTION
53
CALIBRATION C
URVES
54
ZAF M
ETHOD
54
A
TOM
IC N
UM
BER C
ORRECTION
54
A
BSORPTION C
ORRECTION
55
FLUORESCENCE C
ORRECTION
56
PHI-RHO-Z M
ETHOD
57
C
OM
PARISON OF ZAF VS. PHI-RHO-Z M
ETHODS
58
BENCE-ALBEE M
ETHOD
59
S
UM
M
ARY OF M
ATRIX C
ORRECTIONS
59
R
EQUIREM
ENTS FOR Q
UANTITATIVE ANALYSIS
60
LIGHT E
LEM
ENT ANALYSIS
61
THIN FILM ANALYSIS
62
BIOLOGICAL M
ICROANALYSIS
62
M
ONTE CARLO C
ALCULATIONS
62
VI. PRECISION AND ACCURACY
64
DEFINITIONS
64
PRECISION
65
A
BSOLUTE PRECISION
65
RELATIVE PRECISION
65
M
INIM
UM D
ETECTABILITY LIM
IT
65
PRECISION OF SILICON D
RIFT D
ETECTORS
66
PRECISION OF LIGHT E
LEM
ENT D
ETECTORS
66
ACCURACY
66
SUMMARY OF PRECISION AND ACCURACY
67
VII. OPERATING CONDITIONS IN THE MICROSCOPE
68
ACCELERATING VOLTAGE
68
ELECTRON BEAM CURRENT
68
C
ONTRAST
68
RESOLUTION
69
SUMMARY OF OPERATIONS
70
VIII. DIGITAL IMAGING: PROCESSING AND IMAGE MATH
71
CAPTURING THE PERFECT IMAGE
71
PIXEL SIZE AND R
ESOLUTION
72
G
RAYSCALE AND COLOR
73
FILE-TYPES AND C
OM
PRESSION
74
IMAGE PROCESSING
74
O
PERATIONS PERFORM
ED ON O
RIGINAL (COLOR OR GRAYSCALE) IM
AGES
74
C
O
NTRAST/B
RIGHTNESS (H
ISTOGRAM
) TRANSFORM
S
74
G
AM
M
A CORRECTION
75
KERNEL PROCESSING (E.G. SM
OOTHING, SHARPENING, EDGE FINDING,...)
76
B
INARIZATION/THRESHOLDING
77
O
PERATIONS PERFORM
ED ON BINARY IM
AGES
77
EROSION AND DILATION
77
PARTICLE C
UTTING AND HOLE FILLING
77
IMAGE COMPARISON / IMAGE MATH
78
SUMMARY OF DIGITAL IMAGING, PROCESSING AND IMAGE MATH
78
IX. IMAGE AND FEATURE ANALYSIS
79
IMAGE SEGMENTATION/AREA FRACTION
79
FEATURE ANALYSIS
79
M
ORPHOLOGICAL C
HARACTERIZATION
79
CHEM
ICAL C
LASSIFICATION (W
ITH EDS)
84
TYPICAL W
ORKFLOW AND O
UTPUT O
BTAINED BY FEATURE ANALYSIS W
ITH EDS
84
STANDARD METHODS
87
SUMMARY OF IMAGE AND FEATURE ANALYSIS
87
X. X-RAY MAPS AND LINE SCANS
88
ADVANCES IN X-RAY MAPPING TECHNIQUES
88
CONVENTIONAL X-RAY M
AP
88
M
ODERN H
YPERSPECTRAL IM
AGING (HYPERM
AP)
89
M
AXIM
UM PIXEL SPECTRUM
93
BACKGROUND S
UBTRACTION IN ELEM
ENT M
APS
95
Q
UANTITATIVE M
AP (Q
M
AP)
97
CHEM
ICAL PHASE ANALYSIS (AUTOPHASE)
98
LINE SCANS VS. X-RAY MAPS
100
SUMMARY
102
XL APPLICATION EXAMPLES
103
POLYM
ER ANALYSIS
104
Q
UANTIFICATION OF BORON
106
M
APPING BORON W
ITH ED
S
/S
E
M
107
D
ETECTING M
INOR AND TRACE ELEM
ENTS IN CR-NI STEEL
108
D
ISTINGUISHING B
ETW
EEN H
EM
ATITE (FE20
3) AND M
AGNETITE (FE30
4)
109
W
HEN THE SAM
PLE REQUIRES A LOW ACCELERATING VOLTAGE
110
D
ECONVOLUTION OF STRONGLY OVERLAPPING PEAKS
111
ROUTINE S
UB-N
ANOM
ETER RESOLUTION M
APPING W
ITH S
TE
M
/E
D
S
112
EDS ANALYSIS IN STEM
113
REFERENCES
114
INDEX
116
|
| any_adam_object | 1 |
| author | Friel, John J. Terborg, Ralf 1969- Langner, Stefan Salge, Tobias Rohde, Martin Berlin, Jana |
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| callnumber-search | QH212 |
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| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6310 |
| ctrlnum | (OCoLC)1005929379 (DE-599)DNB1130268055 |
| dewey-full | 502.825 530.417 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany 530 - Physics |
| dewey-raw | 502.825 530.417 |
| dewey-search | 502.825 530.417 |
| dewey-sort | 3502.825 |
| dewey-tens | 500 - Natural sciences and mathematics 530 - Physics |
| discipline | Allgemeine Naturwissenschaft Physik |
| edition | 3rd edition |
| format | Book |
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| id | DE-604.BV044490262 |
| illustrated | Illustrated |
| indexdate | 2024-07-10T07:54:23Z |
| institution | BVB |
| institution_GND | (DE-588)10135813-1 |
| isbn | 9783864606748 3864606748 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-029890228 |
| oclc_num | 1005929379 |
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| owner | DE-83 DE-578 |
| owner_facet | DE-83 DE-578 |
| physical | 118 Seiten Illustrationen, Diagramme 29 cm, 580 g 1 ungezähltes Blatt |
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| spelling | Friel, John J. aut X-ray and image analysis in electron microscopy John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz) 3rd edition Berlin Pro Business 2017 118 Seiten Illustrationen, Diagramme 29 cm, 580 g 1 ungezähltes Blatt txt rdacontent n rdamedia nc rdacarrier Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf SDD chemical microanalysis microprobe nanoanalysis nanoscience spectrometry Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Elektronenmikroskop (DE-588)4014326-0 s DE-604 Terborg, Ralf 1969- Verfasser (DE-588)123088771 aut Langner, Stefan Verfasser aut Salge, Tobias Verfasser aut Rohde, Martin Verfasser aut Berlin, Jana Verfasser aut Bruker Nano GmbH isb Pro Business Digital Printing & Copyservice GmbH (Berlin) (DE-588)10135813-1 pbl B:DE-101 application/pdf http://d-nb.info/1130268055/04 Inhaltsverzeichnis DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=029890228&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Friel, John J. Terborg, Ralf 1969- Langner, Stefan Salge, Tobias Rohde, Martin Berlin, Jana X-ray and image analysis in electron microscopy Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenmikroskop (DE-588)4014326-0 gnd |
| subject_GND | (DE-588)4151898-6 (DE-588)4014326-0 |
| title | X-ray and image analysis in electron microscopy |
| title_auth | X-ray and image analysis in electron microscopy |
| title_exact_search | X-ray and image analysis in electron microscopy |
| title_full | X-ray and image analysis in electron microscopy John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz) |
| title_fullStr | X-ray and image analysis in electron microscopy John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz) |
| title_full_unstemmed | X-ray and image analysis in electron microscopy John J. Friel & Ralf Terborg, Stefan Langner, Tobias Salge, Martin Rohde, Jana Berlin (married name: Bergholtz) |
| title_short | X-ray and image analysis in electron microscopy |
| title_sort | x ray and image analysis in electron microscopy |
| topic | Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenmikroskop (DE-588)4014326-0 gnd |
| topic_facet | Elektronenstrahlmikroanalyse Elektronenmikroskop |
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