Magnetometrische Untersuchungen an ultradünnen Ni- und Fe-Epitaxie-Schichten:
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Bibliographic Details
Main Author: Elmers, Hans-Joachim (Author)
Format: Book
Language:German
Published: 1989
Subjects:
Item Description:Clausthal, Techn. Univ., Diss.
Physical Description:III, 164 S. graph. Darst.

There is no print copy available.

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