Deep submicron trends and implications on the design and test of IC's: tutorial B
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
[Los Alamitos, Calif.]
[IEEE Computer Soc. Press]
1996
|
| Schriftenreihe: | Tutorial notes
|
Internformat
MARC
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| 711 | 2 | |a European Design and Test Conference |d 1996 |c Paris |j Sonstige |0 (DE-588)1900624-X |4 oth | |
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Datensatz im Suchindex
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| author | Williams, T. W. Dennard, R. H. |
| author_facet | Williams, T. W. Dennard, R. H. |
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| spelling | Williams, T. W. Verfasser aut Deep submicron trends and implications on the design and test of IC's tutorial B T. W. Williams, R. H. Dennard, European Design & Test Conference and Exhibition [Los Alamitos, Calif.] [IEEE Computer Soc. Press] 1996 txt rdacontent n rdamedia nc rdacarrier Tutorial notes Dennard, R. H. Verfasser aut European Design and Test Conference 1996 Paris Sonstige (DE-588)1900624-X oth |
| spellingShingle | Williams, T. W. Dennard, R. H. Deep submicron trends and implications on the design and test of IC's tutorial B |
| title | Deep submicron trends and implications on the design and test of IC's tutorial B |
| title_auth | Deep submicron trends and implications on the design and test of IC's tutorial B |
| title_exact_search | Deep submicron trends and implications on the design and test of IC's tutorial B |
| title_full | Deep submicron trends and implications on the design and test of IC's tutorial B T. W. Williams, R. H. Dennard, European Design & Test Conference and Exhibition |
| title_fullStr | Deep submicron trends and implications on the design and test of IC's tutorial B T. W. Williams, R. H. Dennard, European Design & Test Conference and Exhibition |
| title_full_unstemmed | Deep submicron trends and implications on the design and test of IC's tutorial B T. W. Williams, R. H. Dennard, European Design & Test Conference and Exhibition |
| title_short | Deep submicron trends and implications on the design and test of IC's |
| title_sort | deep submicron trends and implications on the design and test of ic s tutorial b |
| title_sub | tutorial B |
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