Photo-excited charge collection spectroscopy: probing the traps in field-effect transistors
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | German |
| Veröffentlicht: |
Dordrecht
Springer
2013
|
| Schriftenreihe: | SpringerBriefs in physics
|
| Online-Zugang: | TUM01 UBT01 Volltext |
| Beschreibung: | 1 Online-Ressource |
| ISBN: | 9789400763913 9789400763920 |
| DOI: | 10.1007/978-94-007-6392-0 |
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Datensatz im Suchindex
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| author | Im, Seongil Chang, Youn-Gyoung Kim, Jae Hoon |
| author_facet | Im, Seongil Chang, Youn-Gyoung Kim, Jae Hoon |
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| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-94-007-6392-0 |
| format | Electronic eBook |
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| id | DE-604.BV041042078 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T00:38:22Z |
| institution | BVB |
| isbn | 9789400763913 9789400763920 |
| language | German |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-026019472 |
| oclc_num | 855828003 |
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| physical | 1 Online-Ressource |
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| publishDate | 2013 |
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| publisher | Springer |
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| series2 | SpringerBriefs in physics |
| spelling | Im, Seongil Verfasser aut Photo-excited charge collection spectroscopy probing the traps in field-effect transistors Seongil Im ; Youn-Gyoung Chang ; Jae Hoon Kim Dordrecht Springer 2013 1 Online-Ressource txt rdacontent c rdamedia cr rdacarrier SpringerBriefs in physics Chang, Youn-Gyoung Verfasser aut Kim, Jae Hoon Verfasser aut https://doi.org/10.1007/978-94-007-6392-0 Verlag Volltext |
| spellingShingle | Im, Seongil Chang, Youn-Gyoung Kim, Jae Hoon Photo-excited charge collection spectroscopy probing the traps in field-effect transistors |
| title | Photo-excited charge collection spectroscopy probing the traps in field-effect transistors |
| title_auth | Photo-excited charge collection spectroscopy probing the traps in field-effect transistors |
| title_exact_search | Photo-excited charge collection spectroscopy probing the traps in field-effect transistors |
| title_full | Photo-excited charge collection spectroscopy probing the traps in field-effect transistors Seongil Im ; Youn-Gyoung Chang ; Jae Hoon Kim |
| title_fullStr | Photo-excited charge collection spectroscopy probing the traps in field-effect transistors Seongil Im ; Youn-Gyoung Chang ; Jae Hoon Kim |
| title_full_unstemmed | Photo-excited charge collection spectroscopy probing the traps in field-effect transistors Seongil Im ; Youn-Gyoung Chang ; Jae Hoon Kim |
| title_short | Photo-excited charge collection spectroscopy |
| title_sort | photo excited charge collection spectroscopy probing the traps in field effect transistors |
| title_sub | probing the traps in field-effect transistors |
| url | https://doi.org/10.1007/978-94-007-6392-0 |
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