Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs:
Gespeichert in:
Hauptverfasser: | , , , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Cham
Springer International Publishing
2021
Cham Springer |
Ausgabe: | 1st ed. 2021 |
Schlagworte: | |
Online-Zugang: | BTU01 FAB01 FAW01 FCO01 FHA01 FHD01 FHI01 FHM01 FHN01 FHR01 FKE01 FLA01 FRO01 FWS01 FWS02 HTW01 TUM01 UBY01 UER01 Volltext |
Beschreibung: | 1 Online-Ressource (XIII, 131 p. 89 illus., 86 illus. in color) |
ISBN: | 9783030683689 |
DOI: | 10.1007/978-3-030-68368-9 |
Internformat
MARC
LEADER | 00000nmm a2200000zc 4500 | ||
---|---|---|---|
001 | BV047227181 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | cr|uuu---uuuuu | ||
008 | 210407s2021 |||| o||u| ||||||eng d | ||
020 | |a 9783030683689 |c Online |9 978-3-030-68368-9 | ||
024 | 7 | |a 10.1007/978-3-030-68368-9 |2 doi | |
035 | |a (ZDB-2-ENG)9783030683689 | ||
035 | |a (OCoLC)1249659183 | ||
035 | |a (DE-599)BVBBV047227181 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
049 | |a DE-859 |a DE-860 |a DE-91 |a DE-858 |a DE-1046 |a DE-1043 |a DE-Aug4 |a DE-898 |a DE-861 |a DE-523 |a DE-29 |a DE-863 |a DE-1050 |a DE-862 |a DE-92 |a DE-573 |a DE-M347 |a DE-706 |a DE-634 | ||
082 | 0 | |a 621.3815 |2 23 | |
084 | |a MAS 000 |2 stub | ||
084 | |a ELT 000 |2 stub | ||
100 | 1 | |a Zimpeck, Alexandra |e Verfasser |4 aut | |
245 | 1 | 0 | |a Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs |c by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis |
250 | |a 1st ed. 2021 | ||
264 | 1 | |a Cham |b Springer International Publishing |c 2021 | |
264 | 1 | |a Cham |b Springer | |
300 | |a 1 Online-Ressource (XIII, 131 p. 89 illus., 86 illus. in color) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
650 | 4 | |a Circuits and Systems | |
650 | 4 | |a Electronic Circuits and Devices | |
650 | 4 | |a Electronic circuits | |
700 | 1 | |a Meinhardt, Cristina |4 aut | |
700 | 1 | |a Artola, Laurent |4 aut | |
700 | 1 | |a Reis, Ricardo |4 aut | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-030-68367-2 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-030-68369-6 |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-030-68370-2 |
856 | 4 | 0 | |u https://doi.org/10.1007/978-3-030-68368-9 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-2-ENG | ||
940 | 1 | |q ZDB-2-ENG_2021_Fremddaten | |
999 | |a oai:aleph.bib-bvb.de:BVB01-032631716 | ||
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l BTU01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FAB01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FAW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FCO01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FHA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FHD01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FHI01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FHM01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FHN01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FHR01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FKE01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FLA01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FRO01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FWS01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l FWS02 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l HTW01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l TUM01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l UBY01 |p ZDB-2-ENG |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/978-3-030-68368-9 |l UER01 |p ZDB-2-ENG |x Verlag |3 Volltext |
Datensatz im Suchindex
DE-BY-FWS_katkey | 879951 |
---|---|
_version_ | 1806194495233982464 |
adam_txt | |
any_adam_object | |
any_adam_object_boolean | |
author | Zimpeck, Alexandra Meinhardt, Cristina Artola, Laurent Reis, Ricardo |
author_facet | Zimpeck, Alexandra Meinhardt, Cristina Artola, Laurent Reis, Ricardo |
author_role | aut aut aut aut |
author_sort | Zimpeck, Alexandra |
author_variant | a z az c m cm l a la r r rr |
building | Verbundindex |
bvnumber | BV047227181 |
classification_tum | MAS 000 ELT 000 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)9783030683689 (OCoLC)1249659183 (DE-599)BVBBV047227181 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
discipline_str_mv | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
doi_str_mv | 10.1007/978-3-030-68368-9 |
edition | 1st ed. 2021 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03670nmm a2200709zc 4500</leader><controlfield tag="001">BV047227181</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">210407s2021 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783030683689</subfield><subfield code="c">Online</subfield><subfield code="9">978-3-030-68368-9</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-030-68368-9</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)9783030683689</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1249659183</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV047227181</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-859</subfield><subfield code="a">DE-860</subfield><subfield code="a">DE-91</subfield><subfield code="a">DE-858</subfield><subfield code="a">DE-1046</subfield><subfield code="a">DE-1043</subfield><subfield code="a">DE-Aug4</subfield><subfield code="a">DE-898</subfield><subfield code="a">DE-861</subfield><subfield code="a">DE-523</subfield><subfield code="a">DE-29</subfield><subfield code="a">DE-863</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-862</subfield><subfield code="a">DE-92</subfield><subfield code="a">DE-573</subfield><subfield code="a">DE-M347</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">MAS 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 000</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Zimpeck, Alexandra</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs</subfield><subfield code="c">by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1st ed. 2021</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer International Publishing</subfield><subfield code="c">2021</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIII, 131 p. 89 illus., 86 illus. in color)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic Circuits and Devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Meinhardt, Cristina</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Artola, Laurent</subfield><subfield code="4">aut</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Reis, Ricardo</subfield><subfield code="4">aut</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-68367-2</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-68369-6</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">978-3-030-68370-2</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2021_Fremddaten</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-032631716</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FAB01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FAW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FCO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FHA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FHD01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FHM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FHN01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FHR01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FKE01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FLA01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FRO01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FWS01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">FWS02</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">HTW01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">TUM01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">UBY01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-030-68368-9</subfield><subfield code="l">UER01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV047227181 |
illustrated | Not Illustrated |
index_date | 2024-07-03T16:59:19Z |
indexdate | 2024-08-01T16:08:20Z |
institution | BVB |
isbn | 9783030683689 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-032631716 |
oclc_num | 1249659183 |
open_access_boolean | |
owner | DE-859 DE-860 DE-91 DE-BY-TUM DE-858 DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-29 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
owner_facet | DE-859 DE-860 DE-91 DE-BY-TUM DE-858 DE-1046 DE-1043 DE-Aug4 DE-898 DE-BY-UBR DE-861 DE-523 DE-29 DE-863 DE-BY-FWS DE-1050 DE-862 DE-BY-FWS DE-92 DE-573 DE-M347 DE-706 DE-634 |
physical | 1 Online-Ressource (XIII, 131 p. 89 illus., 86 illus. in color) |
psigel | ZDB-2-ENG ZDB-2-ENG_2021_Fremddaten |
publishDate | 2021 |
publishDateSearch | 2021 |
publishDateSort | 2021 |
publisher | Springer International Publishing Springer |
record_format | marc |
spellingShingle | Zimpeck, Alexandra Meinhardt, Cristina Artola, Laurent Reis, Ricardo Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs Circuits and Systems Electronic Circuits and Devices Electronic circuits |
title | Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs |
title_auth | Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs |
title_exact_search | Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs |
title_exact_search_txtP | Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs |
title_full | Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis |
title_fullStr | Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis |
title_full_unstemmed | Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis |
title_short | Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs |
title_sort | mitigating process variability and soft errors at circuit level for finfets |
topic | Circuits and Systems Electronic Circuits and Devices Electronic circuits |
topic_facet | Circuits and Systems Electronic Circuits and Devices Electronic circuits |
url | https://doi.org/10.1007/978-3-030-68368-9 |
work_keys_str_mv | AT zimpeckalexandra mitigatingprocessvariabilityandsofterrorsatcircuitlevelforfinfets AT meinhardtcristina mitigatingprocessvariabilityandsofterrorsatcircuitlevelforfinfets AT artolalaurent mitigatingprocessvariabilityandsofterrorsatcircuitlevelforfinfets AT reisricardo mitigatingprocessvariabilityandsofterrorsatcircuitlevelforfinfets |