Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test:
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York,NY,United States
Association for Computing Machinery
2020
|
| Schriftenreihe: | ACM Conferences
|
| Online-Zugang: | UBM01 Volltext |
| Beschreibung: | 1 Online-Ressource (122 Seiten) |
| ISBN: | 9781450379571 |
Internformat
MARC
| LEADER | 00000nmm a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV048953604 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 230510m2020 |||| o||u| ||||||eng d | ||
| 020 | |a 9781450379571 |9 978-1-4503-7957-1 | ||
| 035 | |a (ZDB-15-ACM)10.1145/3387903 | ||
| 035 | |a (OCoLC)1379411174 | ||
| 035 | |a (DE-599)BVBBV048953604 | ||
| 040 | |a DE-604 |b ger | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-19 | ||
| 110 | 2 | |a AST '20: IEEE/ACM 15nd International Conference on Automation of Software Test |d 2020 |c Seoul Republic of Korea |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| 246 | 1 | 0 | |a AST '20 |
| 264 | 1 | |a New York,NY,United States |b Association for Computing Machinery |c 2020 | |
| 300 | |a 1 Online-Ressource (122 Seiten) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a ACM Conferences | |
| 710 | 2 | |a Association for Computing Machinery-Digital Library |e Sonstige |4 oth | |
| 710 | 2 | |a ACM Special Interest Group on Software Engineering |e Sonstige |4 oth | |
| 710 | 2 | |a ACM SIGs |e Sonstige |4 oth | |
| 856 | 4 | 0 | |u https://dl.acm.org/action/showBook?doi=10.1145%2F3387903 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-15-ACM | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-034217452 | ||
| 966 | e | |u https://dl.acm.org/action/showBook?doi=10.1145%2F3387903 |l UBM01 |p ZDB-15-ACM |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804185179074330624 |
|---|---|
| adam_txt | |
| any_adam_object | |
| any_adam_object_boolean | |
| author_corporate | AST '20: IEEE/ACM 15nd International Conference on Automation of Software Test |
| author_corporate_role | aut |
| author_facet | AST '20: IEEE/ACM 15nd International Conference on Automation of Software Test |
| author_sort | AST '20: IEEE/ACM 15nd International Conference on Automation of Software Test |
| building | Verbundindex |
| bvnumber | BV048953604 |
| collection | ZDB-15-ACM |
| ctrlnum | (ZDB-15-ACM)10.1145/3387903 (OCoLC)1379411174 (DE-599)BVBBV048953604 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01457nmm a2200361 c 4500</leader><controlfield tag="001">BV048953604</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">230510m2020 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781450379571</subfield><subfield code="9">978-1-4503-7957-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-15-ACM)10.1145/3387903</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1379411174</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV048953604</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-19</subfield></datafield><datafield tag="110" ind1="2" ind2=" "><subfield code="a">AST '20: IEEE/ACM 15nd International Conference on Automation of Software Test</subfield><subfield code="d">2020</subfield><subfield code="c">Seoul Republic of Korea</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test</subfield></datafield><datafield tag="246" ind1="1" ind2="0"><subfield code="a">AST '20</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York,NY,United States</subfield><subfield code="b">Association for Computing Machinery</subfield><subfield code="c">2020</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (122 Seiten)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">ACM Conferences</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Association for Computing Machinery-Digital Library</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ACM Special Interest Group on Software Engineering</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">ACM SIGs</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://dl.acm.org/action/showBook?doi=10.1145%2F3387903</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-15-ACM</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-034217452</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://dl.acm.org/action/showBook?doi=10.1145%2F3387903</subfield><subfield code="l">UBM01</subfield><subfield code="p">ZDB-15-ACM</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV048953604 |
| illustrated | Not Illustrated |
| index_date | 2024-07-03T21:58:57Z |
| indexdate | 2024-07-10T09:51:07Z |
| institution | BVB |
| isbn | 9781450379571 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-034217452 |
| oclc_num | 1379411174 |
| open_access_boolean | |
| owner | DE-19 DE-BY-UBM |
| owner_facet | DE-19 DE-BY-UBM |
| physical | 1 Online-Ressource (122 Seiten) |
| psigel | ZDB-15-ACM |
| publishDate | 2020 |
| publishDateSearch | 2020 |
| publishDateSort | 2020 |
| publisher | Association for Computing Machinery |
| record_format | marc |
| series2 | ACM Conferences |
| spelling | AST '20: IEEE/ACM 15nd International Conference on Automation of Software Test 2020 Seoul Republic of Korea Verfasser aut Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test AST '20 New York,NY,United States Association for Computing Machinery 2020 1 Online-Ressource (122 Seiten) txt rdacontent c rdamedia cr rdacarrier ACM Conferences Association for Computing Machinery-Digital Library Sonstige oth ACM Special Interest Group on Software Engineering Sonstige oth ACM SIGs Sonstige oth https://dl.acm.org/action/showBook?doi=10.1145%2F3387903 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title_alt | AST '20 |
| title_auth | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title_exact_search | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title_exact_search_txtP | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title_full | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title_fullStr | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title_full_unstemmed | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title_short | Proceedings of the IEEE/ACM 1st International Conference on Automation of Software Test |
| title_sort | proceedings of the ieee acm 1st international conference on automation of software test |
| url | https://dl.acm.org/action/showBook?doi=10.1145%2F3387903 |
| work_keys_str_mv | AT ast20ieeeacm15ndinternationalconferenceonautomationofsoftwaretest proceedingsoftheieeeacm1stinternationalconferenceonautomationofsoftwaretest AT associationforcomputingmachinerydigitallibrary proceedingsoftheieeeacm1stinternationalconferenceonautomationofsoftwaretest AT acmspecialinterestgrouponsoftwareengineering proceedingsoftheieeeacm1stinternationalconferenceonautomationofsoftwaretest AT acmsigs proceedingsoftheieeeacm1stinternationalconferenceonautomationofsoftwaretest AT ast20ieeeacm15ndinternationalconferenceonautomationofsoftwaretest ast20 AT associationforcomputingmachinerydigitallibrary ast20 AT acmspecialinterestgrouponsoftwareengineering ast20 AT acmsigs ast20 |